BaySpec, Inc., founded in 1999 with 100% manufacturing in the USA (San Jose, California), is a vertically integrated spectral sensing company. The company designs, manufactures and markets advanced spectral instruments, including UV-VIS-NIR-SWIR spectrometers, benchtop and portable NIR/SWIR and Raman analyzers, confocal Raman microscopes, hyperspectral imagers, mass spectrometers, and OEM spectral engines and components. R&D Applications include:
Materials: Material characterization is an ideal application area for Raman spectroscopy, due to its high chemical specificity and rapid, non-contact measurement. Solid, liquid, or gaseous, nearly all materials possess a unique Raman spectral fingerprint. The technique can be readily scaled to microscopic approaches, allowing interrogation of extremely small volumes and samples, such as nanomaterials. Characterization of nanomaterials is critical to determining structural and conformational properties. Raman spectroscopy is a highly efficient technique to study the electronic properties, compositions, and mechanical stresses in these materials, all of which can manifest in Raman band shape and frequency shift.
Semiconductor: Raman spectroscopy has proven to be one of the most effective tools for characterization of semiconductor properties and for manufacturing process/quality control because materials such as Si, SiGe, InGaAs, GaAs, GaN, and graphene exhibit precise, distinct Raman bands. Applied in a microscopic approach, the Raman technique has been successfully implemented to determine microstructure composition on thin-films, strain in the multilayer device, and to identify defects across the wafer surface.
Process/Reaction: Unlike conventional UV-Vis and NIR monitoring techniques, Raman spectroscopy provides molecular specificity in real-time measurements of gas, liquid, and solid samples, both natural and synthetic. These attributes are responsible for the emerging reliance on Raman spectroscopy for a number of online process and reaction monitoring applications. Numerous sampling options, including fiber optic probes with long reach and stand-off probes for measuring inside containers and vessels make the technique adaptable to a myriad of environments and conditions.
Surface-Enhanced Raman: Surface-enhanced Raman spectroscopy (SERS) utilizes specialized metal substrates to allow Raman signal enhancement up to 10 orders of magnitude. This phenomenon occurs when the molecules of interest are in very close proximity to the metal substrate, and is generally used for evaporated solutions or particle-surface characterization. The enhanced Raman signal with SERS has extended its applications in many fields, such as biological studies, to quantify trace substances or identify very small structures such as cell surface proteins. Intracellular SERS is also possible, via the injection of metallic nanoparticles, to study internal structures and analytes.
Based in Dresden, DIAS Infrared GmbH develops and manufactures high-quality infrared cameras, infrared line cameras, pyrometers, black bodies and infrared detectors for industrial temperature measurements. Also the self-developed software for the display and processing of measurement data ensures an efficient evaluation. A big part of our costumers trust in individual, application specific system solutions and services.
Our owner-managed company that was founded in 1992 employs over 50 high qualified colleagues of which almost the half act in the research and development department. We develop and manufacture our products with high quality standards at our German headquarters in Dresden, Magdeburg and Rudolstadt. Our products have proven themselves over many years with satisfied customers. Our company DIAS Infrared GmbH is certified for many years according to DIN ISO 9001.
In order to always be on the cutting edge of science DIAS works closely with the Technical University of Dresden and is an active member of AMA Association for Sensor Technology.
The headquarter of DIAS Infrared in Dresden (Germany) Your specialist füor non-contact infrared measurement technologyR & D, manufacturing, sales and service from one source.
Worldwide unique product range of fixed non-contact temperature measuring technology from simple pyrometer to complex thermography complete solution
Individual and professional advice, service and installation.
Development, manufacturing, sales and service from one source.
Qualified staff with longtime experience in the field of infrared measuring technology.
The application areas of pyrometers, cameras and infrared sensors are very multi-purpose. The infrared temperature measurement is used everywhere in industrial process measurement technology where you can only measure without contact. Examples for processes lie in the metal and glass processing, R & D projects, traffic control and fire surveillance. Also niche applications in medicine, food industry or doping tests for race horses are examples for the almost the endless potential of high-quality infrared measurement technology.
DIAS Infrared Corp. is open with a principal office in New York State. The company, formed August 1, 2012, is a wholly owned subsidiary of DIAS Infrared GmbH. The subsidiary and new office is designed to better serve our North American customers with expert local sales and application support services. Recent growth in DIAS industrial noncontact temperature measurement systems has made now the right time to concentrate efforts in North America through creation of the subsidiary. DIAS Infrared Corp. now serves as the focal point to manage all North American operations for DIAS IR cameras, pyrometers, and system solutions.
Freiberg Instruments is now one of the world’s fastest growing, young and dynamic analytical instrumentation companies with products covering a broad spectrum of applications in fields/industries like Semiconductor, Microelectronics, Photovoltaic, Dosimetry, Medical Research, Luminescence Dating, X-ray diffraction, Material Research and Electron Spin Resonance.
Established in 2005 as an university spin off from TU Bergakademie – The University of Resources, Freiberg Instruments devoted the first few years to develop and test a whole family of fast, nondestructive, electrical characterization tools under production conditions, measuring parameters like minority carrier lifetime, photoconductivity and resistivity.
MDP Microwave-Detected Photoconductivity:
The advanced method MDP is well suited for both, defect investigation by e.g. injection dependent minority carrier lifetime measurements, as well as mapping of wafers or even ingots for inline metrology. MDP has a variety of advantages in sensitivity, speed and resolution.
MD-PICTS is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished. This allows to do a spatial resolved defect characterization.
The Kelvin Probe is a non-contact, non-destructive vibrating capacitor device used to measure the work function (wf) of conducting materials or surface potential (sp) of semiconductor or insulating surfaces. The wf of a surface is typically defined by the topmost 1-3 layers of atoms or molecules, so the Kelvin Probe is one of the most sensitive surface analysis techniques available. KP Technology Systems offer very high wf resolution of 1-3 meV, currently the highest achieved by any commercial device.
KP Technology Ltd was founded with the aim of bringing to the market new surface research tools. These tools have been designed to allow specialists to investigate surface phenomena, provided equipment pathways for non-specialists and educated scientists, engineers and technologists in the capabilities of these emerging technologies.
Since inception in 2000, KP Technology Ltd has experienced rapid growth and now services over 300 companies and research institutes worldwide in their materials research and characterisation requirements. Our Scottish-based team consists of electronic and software engineers, materials research associates, training, sales and administrative staff.
Today, KP Technology Ltd is the largest kelvin probe manufacturer in the world. Organisations worldwide benefit every day from the research and products from that KP Technology Ltd creates; from Medical Research to Solar Panels. The company’s R&D efforts are focused on bringing new patentable technologies to market for research institutions.
We believe inspiring the next generation of scientists is fundamental to long-term business as well as society. This is why expend large amount of energy and time in helping to organise our local science festival.
We actively promote our unique, self-lead research lab ethos. We go beyond singular subject areas and try to amalgamate seemingly disparate research areas. This creates a pioneering environment that we’re proud off.
Our product range includes:
Single Point Kelvin Probe (ambient and controlled atmosphere)
Scanning Kelvin Probe (ambient and controlled atmosphere)
Ultrahigh vacuum (UHV) Kelvin Probe
Surface Photovoltage (SPV) & Surface Photovoltage Spectroscopy (SPS)
Corrosion Kelvin Probe with Relative Humidity Enclosure
Glovebox System – GB050
NanoFocus AG is a developer, manufacturer, and distributor of measurement technology and software packages for the characterization of technical surfaces. The company has been active in this field since 1994. Our confocal optical 3D surface analysis tools offer perfect quality assurance, process control and manufacturing efficiency for all industries and applications. NanoFocus AG’s analysis systems allow high precision micro and nano scale 3D surface measurements. The innovative systems enable extremely fast, easy and contactless 3D measurements of topography, micro-geometry, roughness or other surface characteristics.
Materials Science Applications:
Optimizing functional properties if new surfaces and products:
Finding out in what way the structure of a material influences its properties and behaviour is the aim of materials science. High-resolution analyses of surfaces play an important role in determining relevant parameters like roughness, relection, tribological properties or the surface quality.
NanoFocus measurement systems guarantee analyses conform to international standards – for different measurement task and on all materials. Defined specifications are met and processes optimized. This means that costs are reduced while development times are shortened.
Non-contact 3D surface analyses independent of materials:
NanoFocus measurement systems enable the fast and reliable 3D surface analysis of nearly all materials – from metal, glass, ceramics, semi-conductors, polymers to organic materials. The confocal technology enables determining reliable measurement data independent of the degree of reflection of a surface. The optical method of the NanoFocus-technologies µsurf, µscan and µsprint also enables the non-destructive measurements of sensible surfaces at different stages of production and processing. The measurements of coated surfaces and the determination of layer thickness are also possible.
A previous sample preparation is not necessary. Real 3D data is available after only a few seconds which allows a qualitative as well as a quantitative evaluation of the surface. For the determination of relevant parameters NanoFocus offers comprehensive and powerful software solutions for the analysis of measurement data.
Examples of application:
NanoFocus measurement systems have proven themselves in many areas of materials science due their flexibility. Within only a few seconds they deliver exact and repeatable 3D measurement data of nearly all surfaces. That is why the NanoFocus-technology is ideal for user who wish to analyze different materials.
The NanoWorld Research and Development team works continuously to meet your future requirements.
We put great emphasis on continuously developing and further improving our well-established products like the Pointprobe® series.
The AFM probes of the Pointprobe series are the most widely used and best known AFM probes worldwide. The product series comprises scanning probes for the widest range of applications.
The Pointprobe AFM probes are available with different coatings like Platinum-Iridium (PtIr5), Magnetic, Diamond or Gold. Additionally we offer special tip versions like our SuperSharpSilicon for high resolution imaging or High Aspect Ratio Tips for deep trench measurements.
Our Arrow series features standard AFM tips for contact, non-contact and force modulation mode that have a tetrahedral tip. The unique Arrow shape of the cantilever allows easy positioning of the tip on the area of interest. Furthermore the Arrow series also includes a range of tipless cantilevers and cantilever arrays.
The Ultra-Short Cantilevers series combines very small cantilevers capable of resonating in the MHz regime and a very sharp and wear resistant tip and is dedicated to High-Speed AFM (HS-AFM). The Ultra-Short Cantilevers series consists of six different types of probes which cover the complete range of high speed scanning applications, from non-contact mode to contact mode, from measurements in air to measurements in liquid
The Pyrex-Nitride series combines silicon nitride cantilevers and tips with the proven glass chip concept. The Pyrex-Nitride series has been designed for a great variety of imaging techniques like in air and liquid. Three different types of Pyrex-Nitride Probes are currently available: AFM probes with rectangular cantilevers, AFM probes with triangular cantilevers and AFM probes with tipless triangular cantilevers.
Special AFM Probes can be designed and manufactured upon customer’s request.
Novacam Technologies Inc. designs and manufactures high-precision optical sensor systems for 3D metrology applications in industry and biomedicine. Our systems are based on low-coherence interferometry and feature fiber-based non-contact scanning probes.
Our products include:
Profilometer (profiler) systems and 3D scanners for 3D metrology, roughness measurements, thickness measurements, and cross-sectional imaging in high-precision industries
Optical coherence tomography (OCT) systems for tissue measurement and imaging in biomedicine and life sciences
Modular hardware components for original equipment manuracturers (OEMs) and for R&D
Custom metrology solutions based on low-coherence interferometry
Novacam products are used internationally in online high-technology manufacturing processes, QA/QC laboratories, R&D laboratories, and bio-medical research institutes. Clients value Novacam systems for their high precision, high speed, versatility of installation, the ability to inspect hard-to-reach surfaces and the ability to operate in hostile environments.
Novacam also partners with system integrators and OEMs who wish to incorporate Novacam advanced OCT platform components into custom assemblies for vertical markets.
Founded in 1997, Novacam is a privately held company.
3D metrology in hard-to-reach spaces, such as inside bores, cylinders and narrow tubes;
Thickness of multi-layer or single-layer films;
Roughness, including shape, flatness and waviness;
Volume loss from surface wear; High aspect ratio features, such as steps, grooves, channels, steep slopes and holes;
Hostile environments including radioactive, very high temperature, cryogenic; Non-transparent material thickness with LIBS and profilometry
Sensofar Group is a multi-national company whose mission is to develop, manufacture and commercialize high-end metrology tools. The Group also provides consultancy within the field of metrology, and pursues a philosophy of guaranteeing advanced techniques, high quality and customer services.
Our experienced team of scientists and engineers, with extensive research experience and direct knowledge of the industry, provides the necessary key strengths to ensure the success of the company: high-quality products and faultless customer service, the ability to develop high-end custom applications and diverse optical metrology projects, and the flexibility to adapt our business to the market needs.
R&D is an additional goal of the company. We have been combining the new product lines with some value-added improvements based on our comprehensive knowledge of the optical metrology field and by working very closely with the CD6-UPC. Through this relationship, Sensofar is able to continually consolidate its expertise in its core technologies: non-contact optical 3D surface measurements.
The Sensofar Group headquarters is located close to Barcelona, in the technological heart of Spain. The Group is represented in over 20 countries through a global network based on strategically placed partners, and has its own offices in Asia, Japan and the United States.
Solarius Development Inc., located in the heart of the Silicon Valley, is a leading manufacturer of non-contact 3D metrology systems.
Extending the scope of 3D surface measurement technology is the center point of the company mission. Solarius Development is committed to meeting the demands of ever-increasing miniaturization, developing tools to measure in the nanometric world. This has been accomplished by drawing on resources from industry as well as development in universities to advance its core technologies of non-contact 3D optical measurement.
Applying these core technologies as well as an impressive array of software tools has allowed the company to provide its customers with cutting-edge turnkey instrumentation. These instruments are used in critical product development cycles as well as in industrial environments for quality control. Customers benefit from faster development cycles as well as improved product yield in manufacturing.
White Light Chromatic
The SURAGUS GmbH develops, manufactures and sells eddy current-based testing technology for innovative testing tasks. The company uses new technological opportunities due to advances in signal processing, the availability of more powerful computing technologies and possibilities of new manufacturing and miniaturization methods. Applications are amongst others quality control of structured and unstructured functional layers, quality assurance of carbon fiber materials and classic conductive materials. The company is a spin-off and licensees of the Fraunhofer IKTS Dresden.
The eddy current method utilizes local conductivity variations of the test objects for the characterization of correlated quality characteristics such as thickness, conductivity, homogeneity and purity or physical changes. The complex eddy current signal contains various information about the test object which can be separated in many cases with simple or complex algorithms. Our eddy current testing technology is based on a powerful eddy current electronics with a frequency range from 10 kHz to 100 MHz, which is combined with different sensor concepts depending on the application.
Fast (EddyCus Systems measure at a rate of 50.000 measurements per second)
Suitable for automation
Broad portfolio of sensors for different applications
Contactless Conductivity measurement of functional thin films (e.g. TCOs, CNTs, Metallization, Silver-Nanowire)
Non-contact Orientation testing and flaw detection for Carbon fiber composites (undulations, Impacts, gases, thrust faults)
Contactless weight determination in many carbon fiber materials
Determination of gradients of super-alloys
Layer thickness measurement of thin films and coatings from 5 nm thickness
Mapping for errors in conductive layer system (cracks, voids, delaminations, etc.)