Aabspec’s products support ultra-high temperature spectroscopy (to 950 C for solids/450 C for fluids); low-temperature spectroscopy (to -170 C); high pressure spectroscopy (to 10,000psig); vacuum spectroscopy (to 10-8torr); transmission, specular and large angle reflectance; irradiation (UV, etc); Raman; GC-FTIR; TGA-FTIR; LC-FTIR; GPC-FTIR; direct-evolved gas analysis -FTIR; SFC-FTIR; variable temperature/variable pressure FTIR microscopy; dual-sample comparitive spectroscopy; Raman microscopy and special application products. The company’s products cover IR, near-IR, Far Infrared, VIS, and UV optical ranges.
Aabspec has available a computer addressable DVD showing its advanced products for spectroscopy and microscopy. In the DVD, Val Rossiter presents technical details on each product in the Aabspec range, describing structure, special features and applications. A conversational style provides easy one-to-one information of the sort normally obtained by attending an exhibition, but without the journey!
Topics include Raman Spectroscopy and Microscopy, FTIR interfacing for GC, LC, GPC, SFC, TGA, Evolved Gas Analysis, Low to High Temperature, Ultra-High Vacuum to High Pressure, Dual Sampling together with Multiple Optical Modes including Sample Irradiation.
Applications include Thermal Analysis, Environment, Hazardous Samples, High Temperature & High Pressure Reaction Monitoring, Materials Testing, Catalysts, Pharmaceuticals, Polymers.
Advanced Research Systems, Inc. was started in 1986 by Ravi Bains to provide cryogenic solutions for low temperature research. ARS has evolved as a world class manufacturer of closed cycle cryocoolers and laboratory cryogenic systems. ARS is the only major supplier of laboratory cryostats that also manufactures 4 K closed cycle cryocoolers for its use.
Manufacturing our own cryocoolers allows us to seamlessly adapt our cryostats for challenging applications where the cryocooler must be customized for a specific application. ARS has sales and service capabilities worldwide, with an international sales force that is well trained to support our customers and provide guidance in the selection of cryogenic equipment that suits customers’ needs at a fair price.
We recognize that the quality of both our product and our customer relationships determines our future success in this competitive world. To facilitate this, we continue to invest in improving and expanding our capabilities and in developing new products for the future. We feel that the close working relationships we have forged with our customers over the years are testimony to our success.
Helium Flow Cryostats
Sample in Vacuum Cryostats
Sample in Vapor Cryostats
Ultra Low Vibration Cryostats
ICEFLY Cryogenic Delivery System
Scanning Tunneling Microscopy
AEP is the world leader in surface metrology and technology innovation. From its inception it has developed cutting edge instruments to aid researchers and users. As the pioneers of innovation in hi tech engineering, it has grown steadily in worldwide markets. Currently it has offices in America, Asia and Europe.
In addition to manufacturing optical profiler, interferometer and contact profilometer AEP also produces ex-situ and in-situ stress monitors for thin film deposition processes. Please contact us for any questions. Our team of scientists from silicon valley are always excited to answer your questions and help solve your problems.
Step heights measurement
Surface Roughness measurement
Quantify scratch and dig features, wear depth, width and volume
Flatness or curvature measurement
2D thin film stress measurement
Surface Profiling – defect, features etc. depth, width and volume
AFM Workshop’s mission is to develop and market innovative Atomic Force Microscope products and components for research, development, OEMs and education. We support our customers with workshops on the construction, operation and applications of our products. We are committed to an open architecture that facilitates innovation by our customers.
Dr. Paul West is the founder of AFMWorkshop. Dr. West began his career working with scanning tunneling microscopes (STM) as a postdoc at the California Institute of Technology in 1983 where he built one of the world’s first STMs. His career in the development and application of scanning probe microscopes spans over 30 years.
Paul pioneered the investigation of nanotechnology applications for scanning probe microscope (SPM) technology, resulting in patents for nanoscale motion sensors (US Patent #5,009,111, nanoscale position sensors (US patent #5,257,024) and nanoscale digital mass storage (US patent # 4,956,817).
Innovative SPM products invented by Dr. West include:
Fully integrated AFM system having motorized sample positioners, a video microscope and vibration isolation (U.S. Patent #5,291,775).
Tip scanning light lever AFM (U.S. Patent # 5,319,960)
Resistive scanning thermal sensing probes (U.S. Patent #5,441,343)
Integrated AFM with SEM (U.S. Patent #5,455,420)
Dr. West holds patents for many additional AFM/SPM products and applications.
In thirty years of AFM instrument innovation, Dr. West has founded several Atomic Force Microscope manufacturing companies. Over the years, those companies and their patents were acquired by companies such as Agilent Technologies, and ThermoElectron/Veeco/Bruker. Thousands of atomic force microscopes developed by Dr. West are in use throughout the world and have resulted in many scientific publications, Ph.D. dissertations, and technical breakthroughs.
Alrad is a provider of high quality scientific equipment to industry and research. Our main product areas cover Machine Vision components, Optical Detectors and laser products.
Through our three trading divisions, Alrad Imaging, Alrad Electronics and Alrad Photonics, we offer thousands of product items from the world’s leading manufacturers. We also provide installation, demonstration, and product support services.
Many of our principals we represent as a sole distributor in the UK. Some of these exclusive companies have been with us since the 1970s so you see many of our distribution agreements have been in place for a very long time and that must say something about the service we offer. The products and service we provide open up new opportunities for our customers to improve quality, automation and productivity that is why many of our existing customers have been experiencing ALRAD high quality service for decades.
Angstrom Sun Technologies Inc. is a privately held company, headquartered in Boston, USA. The focus of company is to provide a series of cost-effective optical solutions for characterizing thin film thickness, thick coating thickness, their optical properties (refractive index N and extinction coefficient K), surface and interface behavior, alloy concentrations and their uniformities across surface.
Affordable, low cost, but advanced and high performance tools, including spectroscopic reflectometer, microspectrophotometer, microreflectometer, film thickness mapping system, simple desktop film thickness station, and automatic variable angle spectroscopic ellipsometers, offer a way to probe film stacks nondestructively and precisely. In addition, Angstrom Sun Technologies Inc. also delivers advanced analytical services for characterizing thin films, thick coatings and complicated layer stacks.
Angstrom Sun Technologies Inc. designs and manufactures all TFProbe tools in a facility located in Boston, USA. TFProbe tools are sold and distributed by international sales networks.
With performance and professional support as our mission, Angstrom has established a worldwide customer base since 2002, including well-known education institutions, government agencies and Fortune 500 companies, such as NASA Marshall Space Flight Center, National Institute of Standards and Technology, Massachusetts Institute of Technology (MIT), Seoul National University, NanoTech Center (CESTM) at SUNY, Columbia University, Hewlett-Packard Co., Lockheed Martin Co., General Electric (GE), Corning Inc., Bell Laboratories, Johnson-Johnson, Mylan Technologies, Applied Materials (AMAT), Lam Research, Samsung Advanced Institute of Technology(SAIT), and MIT Lincoln Laboratory.
Thin Film Mapping Systems
Integrated In-line Metrology
Angstrom Scientific Inc. is a distributor and manufacturer’s representative, focused on providing characterization solutions to the nanotech marketplace in the Americas. Companies represented:
Provides surface analysis solutions in a number of key application areas.
Deben manufactures innovative accessories for SEM’s and TEM’s, along with a large range of in-situ tensile testing stages for use with Optical Microscopes, X-Ray CT and XRD systems.
DENSsolution is a leading supplier of top quality sample management solutions to enable atomic resolution, dynamic in-situ electron microscopy.
Encapsulix addresses the geometric scaling of critical Atomic Layer Deposition (ALD) requirements for industrial & microelectronic devices and films. Initial process focus is in thin Al2O3, TiO2 and ZnO specifically for encapsulation and barrier coatings.
Hitachi Nanotechnology Systems Division:
Hitachi Nanotechnology Systems Division (NSD) supportscustomers with a wide range of instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.
Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology.
Kleindiek Nanotechnik offers a new level of precision in manipulation, probing, and characterization of nano-materials and semiconductors
Mel-Build provides a wide verity of specialized holders for Transmission Electron Microscopes.
Microtrac strives to provide the materials characterization world with innovative, reliable, and repeatable particle size, particle shape, particle charge, and surface area analysis instrumentation.
XEI Scientific, Inc.provides an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.
Anton Paar TriTec SA (previously CSM Instruments) has been leader in the development of instruments for surface mechanical properties characterization for over 30 years in both research and industrial fields.
CSM Instruments develops, manufactures and sells instruments to characterize mechanical properties of surfaces. We have been the world leader in this market for more than 30 years, first under the name of LSRH then CSEM.
CSM Instruments provides equipment that allows the mechanical characterization of a wide range of surfaces and bulk materials. Adhesion of paints, optical thin films or hard coatings can be defined using one of our Scratch Testers. These span the nano to the macro range to analyze the widest range of materials. Dynamic testing measurements can be performed to define not only the hardness of the material, but also to evaluate the plastic and elastic deformation, the elasticity module, creep and much more. For wear testing we offer the Tribometer, based on the pin-on-disc principle that operates both in the Micro and Nano regime; to record the frictional coefficient and measure the wear volume. Other equipment measures film thickness. Additionally, CSM provides three dimensional viewing capabilities of sample surfaces under most testing regimes.
Coating Thickness by Calotest
After its foundation in 1988, ASCONA has become a specialist in optical profile measuring technology and is now internationally renowned in this sector.
Both the software and the optical measuring systems are developed and produced by ASCONA itself.
More than 300 system installations in the aluminium, plastics, rubber, metal and electronics sector are convincing proof of our competence.
We have set the focus of our activities on optical profile measuring technology and this is why we have accumulated a unique know-how in this speciality sector. Our software PROMEX CONTROL and the horizontal projection process for profile measurement are only some of the results.
ATAGO has been the leader in refractometer technology for over 73 years. The history of Refractometers began with a basic model a simple analog instrument. Today, refractometers are highly sophisticated due to the advancement of technology and the incorporation of high precision electronics into a refractometer.