Electron Microscopy

Ansgtrom Scientific, Ramsey NJ, USA
Address: PO Box 663, Ramsey, NJ 07446, USA
Long Business Description:

Angstrom Scientific Inc. is a distributor and manufacturer’s representative, focused on providing characterization solutions to the nanotech marketplace in the Americas. Companies represented:

BioNavis:
Provides surface analysis solutions in a number of key application areas.

DEBEN:
Deben manufactures innovative accessories for SEM’s and TEM’s, along with a large range of in-situ tensile testing stages for use with Optical Microscopes, X-Ray CT and XRD systems.

DENSsolutions:
DENSsolution is a leading supplier of top quality sample management solutions to enable atomic resolution, dynamic in-situ electron microscopy.

Encapsulix:
Encapsulix addresses the geometric scaling of critical Atomic Layer Deposition (ALD) requirements for industrial & microelectronic devices and films. Initial process focus is in thin Al2O3, TiO2 and ZnO specifically for encapsulation and barrier coatings.

Hitachi Nanotechnology Systems Division:
Hitachi Nanotechnology Systems Division (NSD) supportscustomers with a wide range of instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.

Jordan Valley:
Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology.

Kleindiek Nanotechnik
Kleindiek Nanotechnik offers a new level of precision in manipulation, probing, and characterization of nano-materials and semiconductors

Mel-build:
Mel-Build provides a wide verity of specialized holders for Transmission Electron Microscopes.

Microtrac:
Microtrac strives to provide the materials characterization world with innovative, reliable, and repeatable particle size, particle shape, particle charge, and surface area analysis instrumentation.

XEI Scientific:
XEI Scientific, Inc.provides an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.

Business Website Address: www.angstrom.us
Address: Am Studio 2D, Berlin 12489, Germany
Long Business Description:

Bruker Nano Analytics presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes.
With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.
Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.
Besides this unparalleled range of analytical tools for electron microscopes (EM), Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.
As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers to you innovative high-performance technology. With our worldwide network of service centers and application specialists we are always close to your analytical needs.

Products
EM Analyzers: Advancing Materials Characterization in EM
Micro-XRF and TXRF: Elemental Analysis in Research and Industry

Business Website Address: https://www.bruker.com/
Delmic B.V, Delft, The Netherlands
Address: Thijsseweg 11, 2629 JA Delft, The Netherlands
Long Business Description:

Delmic B.V. is a company based in Delft, the Netherlands that produces correlative light and electron microscopy solutions. Currently, DELMIC produces three systems, the SECOM, a platform for integrated fluourescence and electron microscopy, the SPARC, a high-performance cathodolumiscence detection system, and the Delphi, the world’s first fully integrated fluourescence and scanning electron microscope and the product of a collaboration with Phenom-World. These systems are also accompanied by ODEMIS, open-source software designed to navigate the integrated microscopy systems and to optimize image overlay.

Delmic originated as a result of the development of the SECOM platform, an integrated fluorescence and scanning electron microscope which was conceived by Charged Particle Optics group of Delft University of Technology. At the end of 2011 the company obtained the SPARC system from the Photonic Materials Group group at AMOLF. At the International Microscopy Conference in 2014, DELMIC also launched the Delphi system, a tabletop correlative microscopy solution that, like SECOM, combines a scanning electron microscope with fluorescence microscopy.

Business Website Address: http://www.delmic.com/about.php
Address: 66 Bis Avenue de Verdun, 33610 CESTAS, France
Long Business Description:

EDEN Instruments specializes in the resale of high-tech equipment used in electron microscopy.

Business Website Address: www.eden-instruments.com
Address: 12 Hamada St., Rehovot, 76703, Israel
Long Business Description:

El-Mul Technologies is an innovative and experienced solution provider and OEM manufacturer of in-vacuum charged particle detection systems and devices.
With over 20 years of experience, El-Mul is recognized for its ground-breaking products, world-class quality standards and dedicated service.
El-Mul’s products are specially designed for advanced analytical SEM/TEM systems, focused ion beam (FIB) tools, inspection and metrology semiconductor e-beam tools, mass spectrometry and other vacuum systems

Business Website Address: http://www.el-mul.com/
Address: 2486 HWY 206, Belle Mead, NJ 08502, USA
Long Business Description:

Evex Analytical Instruments Inc manufactures and designs analytical scientific instruments:
Electron Microscopes
X-ray Sensors
EDS Spectrometers
Tools for NanoAnalysis

Address: 5350 NE Dawson Creek Drive, Hillsboro, OR 97124, USA
Long Business Description:

With more than 60 years of innovation and leadership, FEI enables customers to find meaningful answers to questions that accelerate breakthrough discoveries, increase productivity, and ultimately change the world. FEI designs, manufactures, and supports the broadest range of high-performance microscopy workflows that provide images and answers in the micro-, nano-, and picometer scales.
Combining hardware and software expertise in electron, ion, and light microscopy with deep application knowledge in the materials science, life sciences, electronics, and natural resources markets, the worldwide FEI team of 2,700+ employees is dedicated to customers’ pursuit of discovery and resolution to global challenges.

Business Website Address: http://www.fei.com/
Business Phone or Fax: +1 (503) 726-2570
Address: 23042 Alcalde Drive, Suite E, Laguna Hills, CA 92653, USA
Long Business Description:

We provide high performance environmental solutions for precision instruments. This includes our acoustic enclosures, vibration isolation systems, Faraday cages and site survey tools. We specialize in supporting nanotechnology research.

Materials Science Applications:
AFM/SPM
Interferometry
Nanoindentation
Raman Spectroscopy
SEM
Spectroscopy
Unique Instruments

Business Website Address: http://www.herzan.com/
Address: 10 North Martingale Road, Suite 500, Schaumburg, IL60173-2295, USA
Long Business Description:

Analytical Systems:
Thermal Analysis
High Performance Liquid Chromatographs (HPLC) & Amino Acid Analyzers (AAA)
Spectrophotometers (UV-Vis IR, FL)
ICP-OES/ICP-MS
XRF Analysis
XRF Coating Thickness Measurements

Microscopes:
Electron Microscopes (SEM, TEM, STEM)
Focus Ion Beam Systems (FIB, FIB-SEM)
Sample Preparation
Atomic Force Microscopes (AFM)

Business Phone or Fax: Fax (847) 273-4407
Image Metrology, Horsholm, Denmark
Address: Lyngsø Alle 3A, Horsholm DK-2970, Denmark
Long Business Description:

SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 61 countries.

SPIP™ supports 104 file formats for various instrument types, including:
SPM, AFM, STM
SEM, TEM
Interferometers
Confocal Microscopes
Profilers
Optical Microscopes

Business Website Address: http://www.imagemet.com/