Angstrom Scientific Inc. is a distributor and manufacturer’s representative, focused on providing characterization solutions to the nanotech marketplace in the Americas. Companies represented:
Provides surface analysis solutions in a number of key application areas.
Deben manufactures innovative accessories for SEM’s and TEM’s, along with a large range of in-situ tensile testing stages for use with Optical Microscopes, X-Ray CT and XRD systems.
DENSsolution is a leading supplier of top quality sample management solutions to enable atomic resolution, dynamic in-situ electron microscopy.
Encapsulix addresses the geometric scaling of critical Atomic Layer Deposition (ALD) requirements for industrial & microelectronic devices and films. Initial process focus is in thin Al2O3, TiO2 and ZnO specifically for encapsulation and barrier coatings.
Hitachi Nanotechnology Systems Division:
Hitachi Nanotechnology Systems Division (NSD) supportscustomers with a wide range of instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.
Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology.
Kleindiek Nanotechnik offers a new level of precision in manipulation, probing, and characterization of nano-materials and semiconductors
Mel-Build provides a wide verity of specialized holders for Transmission Electron Microscopes.
Microtrac strives to provide the materials characterization world with innovative, reliable, and repeatable particle size, particle shape, particle charge, and surface area analysis instrumentation.
XEI Scientific, Inc.provides an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.
Bruker Nano Analytics presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes.
With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.
Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.
Besides this unparalleled range of analytical tools for electron microscopes (EM), Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.
As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers to you innovative high-performance technology. With our worldwide network of service centers and application specialists we are always close to your analytical needs.
EM Analyzers: Advancing Materials Characterization in EM
Micro-XRF and TXRF: Elemental Analysis in Research and Industry
Delmic B.V. is a company based in Delft, the Netherlands that produces correlative light and electron microscopy solutions. Currently, DELMIC produces three systems, the SECOM, a platform for integrated fluourescence and electron microscopy, the SPARC, a high-performance cathodolumiscence detection system, and the Delphi, the world’s first fully integrated fluourescence and scanning electron microscope and the product of a collaboration with Phenom-World. These systems are also accompanied by ODEMIS, open-source software designed to navigate the integrated microscopy systems and to optimize image overlay.
Delmic originated as a result of the development of the SECOM platform, an integrated fluorescence and scanning electron microscope which was conceived by Charged Particle Optics group of Delft University of Technology. At the end of 2011 the company obtained the SPARC system from the Photonic Materials Group group at AMOLF. At the International Microscopy Conference in 2014, DELMIC also launched the Delphi system, a tabletop correlative microscopy solution that, like SECOM, combines a scanning electron microscope with fluorescence microscopy.
El-Mul Technologies is an innovative and experienced solution provider and OEM manufacturer of in-vacuum charged particle detection systems and devices.
With over 20 years of experience, El-Mul is recognized for its ground-breaking products, world-class quality standards and dedicated service.
El-Mul’s products are specially designed for advanced analytical SEM/TEM systems, focused ion beam (FIB) tools, inspection and metrology semiconductor e-beam tools, mass spectrometry and other vacuum systems
Evex Analytical Instruments Inc manufactures and designs analytical scientific instruments:
Tools for NanoAnalysis
With more than 60 years of innovation and leadership, FEI enables customers to find meaningful answers to questions that accelerate breakthrough discoveries, increase productivity, and ultimately change the world. FEI designs, manufactures, and supports the broadest range of high-performance microscopy workflows that provide images and answers in the micro-, nano-, and picometer scales.
Combining hardware and software expertise in electron, ion, and light microscopy with deep application knowledge in the materials science, life sciences, electronics, and natural resources markets, the worldwide FEI team of 2,700+ employees is dedicated to customers’ pursuit of discovery and resolution to global challenges.
We provide high performance environmental solutions for precision instruments. This includes our acoustic enclosures, vibration isolation systems, Faraday cages and site survey tools. We specialize in supporting nanotechnology research.
Materials Science Applications:
High Performance Liquid Chromatographs (HPLC) & Amino Acid Analyzers (AAA)
Spectrophotometers (UV-Vis IR, FL)
XRF Coating Thickness Measurements
Electron Microscopes (SEM, TEM, STEM)
Focus Ion Beam Systems (FIB, FIB-SEM)
Atomic Force Microscopes (AFM)
SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 61 countries.
SPIP™ supports 104 file formats for various instrument types, including:
SPM, AFM, STM