Atomic Force Microscopy
Designer and manufacturer of probes with carbon nanotube tips for atomic force microscopes.
New CDI FN Series a new series of CNT probes at a new low price.
CDI FN Series Carbon Nanotube probes capture all the advantages of a CNT tipped probe with no compromises. Extremely high aspect ratios (up to 20:1) Exceptionally long wear (up to 200x longer than silicon/SiN and 50x longer than High-Density, Diamond Like Carbon (HDC/DLC)) and the smallest ROC on the market for a High Aspect Ratio probe (1nm ROC).
Using a CDI patented process, the carbon nanotube AFM probe has been perfected. Straightened carbon nanotubes can deliver the radius of curvature needed for high resolution imaging combined with the tube structure necessary for high topography Imaging. All in a single probe with a useable lifetime up to 200x your standard probes.
Torrance, CA 90505
Heidelberg Instruments is one of the world leaders in the production of laser lithography systems, with more than thirty years of experience in maskless lithography and with an installation base of more than 850 systems worldwide. The company offers a variety of maskless pattern generator systems: these range from small and easy to use tabletop systems to highly complex photomask production equipment with exposure areas of several square meters. Heidelberg Instruments systems are installed in academic and industrial sites in more than 50 countries and are used in research, development and production. Applications include MEMS, BioMEMS, Nanotechnology, ASICS, TFT, Micro Optics and others.
Nanonics Imaging Ltd has developed a unique and highly differentiated product portfolio in the area of Scanning Probe Microscopy (SPM). Over the last two decades its products have stood at the forefront of technology providing answers for a wide range of nanotechnological applications unavailable with other measurement tools.
In this area of SPM, Nanonics Imaging is one of the most innovative companies in the world and this innovation together with unparalleled customer support and collaboration has been the basis of its growth. Today Nanonics has 45 employees in its Jerusalem headquarters and representatives throughout the world.
Nanonics Imaging Ltd. was the first to realize that the integration of scanning probe microscopes with other standard techniques, such as optical microscopy, Raman microprobes, scanning electron microscopes and ion beam microscopes, would introduce critical added value to many of these measurement tools. Thus, its products were developed with such integration in mind and in a variety of these areas it was the first to market such products. It presently has singular and leading offerings in each of these areas.
Furthermore, Nanonics Imaging effectively overcame barriers that had prevented introduction of scanning multi probe microscopes, SPM systems with more than one probe. It was the first company and is still the only company to have a general multiprobe SPM solution including all forms of SPM measurements such as electrical, thermal, optical, mechanical etc.
In addition to the above, a central development of the Company is a novel form of optical microscopy invented by the Founder of Nanonics Imaging, Aaron Lewis. This technique is called Near-Field Scanning Optical Microscopy (NSOM) and Nanonics is a leader in this field worldwide. NSOM is being increasingly recognized as being critical in advancing areas of nano optics and in characterizing plasmonic and photonic devices, optical circuits, advanced opto-electronic components, silicon waveguides and devices and photonic band gap materials and devices.
These nano-optical measurement capabilities even extend to electron and ion beam instrumentation and this has brought super-resolution optical imaging to such areas as cathodoluminescence which have been limited in resolution by far-field optical methods.
In each area of its product offerings Nanonics Imaging has won numerous awards over the years. These awards cover all areas of microscopic innovation including Raman microprobe integration, multiprobe development, unparalleled scanner advances, forefront probe technologies etc. The company has collaborated with numerous companies such as Renishaw Plc, FEI etc providing SPM solutions that transform the offerings of these partners and allow them to reach new nanotechnological horizons.
In parallel Nanonics also has evolved a NanoTool KitTM of probes that are both multiprobe friendly and do not obscure the optical or the electron/ion optical axis of the microscope. This NanoToolKitTM includes optical, electrical, thermal and even probes providing nanovacuum and nanochemical writing capabilities. These latter probes allow for a unique methodology called NanoFountain Pen Nanochemistry which even permits nanochemical lithography on any surface and with any ink including inks that are gaseous reagents.
With its NanoToolKitTM and its highly differentiated offerings of SPM systems, fully protected by a portfolio of patents, Nanonics has shown great potential to provide measurement capabilities that simply have been unachievable in the past. In essence, the Nanonics Imaging combination of products forms the basis of a variety of measurement technologies that are increasingly becoming an integral component in a penetrating nanotechnological revolution that stands at the forefront of present and future technological revolutions.
NSOM & SNOM SPM
Multiprobe AFM, NSOM & Raman
Low Temp AFM, NSOM & Raman
AFM SEM FIB
AFM &SPM Probes
PHASIS is a spin-off company of the University of Geneva, which is a renowned academic research institution in the fields of thin film technology, and ferroelectric and superconducting materials. The University of Geneva is also the home institution of MaNEP, the Swiss National Centre of Competence in Research Materials with Novel Electronic Properties.
PHASIS activities are concentrated on the production and distribution of gold substrates, epitaxial gold thin films and epitaxial PZT thin films for both academic and industrial research, and practical applications. Surrounded with excellent know-how and research expertise, PHASIS has a strong commitment to applied research.
PHASIS is involved in several applied research projects with both academic and industrial partners. For example, PHASIS is interested in the use of new materials to bring new insights in the field of gas sensors. Moreover, the flexibility of PHASIS’ equipment allows the production of thin films with tailored properties.
Surface quality control is a perpetual challenge. PHASIS provides local probe surface analysis using Atomic Force Microscopy (AFM) and/or Scanning Tunneling Microscopy (STM).
PHASIS is therefore very open to any special request.
Established in 1991, Piezosystem Jena offers piezo micro positioning, piezo nano positioning and metrology solutions to the semiconductor, microscopy and synchrotron community. We have an extensive knowledge and in-depth technical expertise in the application of piezo technology to nano positioning tasks, and in the design of piezo flexure stages and development of piezomechanical systems.
Piezo based instruments are equipped with our unique piezo technology and offer XY or 3D motion with nearly unlimited resolution. Our metrology lab, with high resolution distance measuring interferometers, allows us to perform tests on custom loading configurations of piezo stages, z-axis microscopy piezo elements and piezo actuator systems with a resolution down to 50 picometers. Accurate determination of primary resonances is one of many services we can offer to our customers, ensuring that the system we provide will meet the most demanding nano positioning tasks.
Piezosystem Jena’s real strength comes from our commitment to complete customer satisfaction in the markets we serve. The partnerships we form with our clientele in applications such as super resolution microscopy, AFM, process control, semiconductor metrology and nanopositioning for synchrotron radiation are long-lasting and mutually beneficial. Our knowledge in piezo technology comes as much from our interaction as consultants as it does from our own research.
Outstanding Characteristics of Piezo Elements:
Nearly unlimited resolution of the movement (sub nm)
Extemely high maximum compressive forces (multiple kN)
Movement without any mechanical play
Very short response times
No mechanical wear
Suitable for vacuum applications
Suitable for cryogenic temperatures
Piezosystem Jena develops and manufatures precision systems e.g. for the following high-tech markets:
Customized solutions to fit your special requests
More than 24 years of experience in the production and development of nanopositioning equipment
Worldwide Partners, Quick Support Guaranteed
Quick Solution Propositions
For nearly 50 years, TREK , INC. has been providing innovative electrostatic measurement and high-voltage power solutions to customers worldwide. Trek’s superior engineering design capability and manufacturing facilities allow us to provide high quality, cost-effective products and services to meet market needs and customer-specific applications.
Our proprietary technology and technical expertise, coupled with our long-term relationships, sets us apart from our competitors and has made us the leader in the markets we serve.
Trek’s commitment to develop new technologies will enable us to continue to provide current and future customers with innovative solutions.
A significant portion of Trek’s business is derived from the design and manufacture of custom products for OEM customers. Trek has been supplying solutions to some of these customers for over 20 years. Although we cannot disclose information about our custom OEM designs, the following provides some perspective on our capabilities. If this information interests you, please contact us to initiate a dialogue regarding your specific requirements for custom-designed product solutions.
Research & Development
Metrology: These products are used for precision measurements of voltage and surface charge distributions; resistance and resistivity meters are also utilized.