Detectors and Sources for THz and IR

$125.00

IR and THz technologies are widely used in security screening and surveillance, astronomy, spectroscopy, biomedicine, food and package inspection, detection of concealed weapons, vision through camouflage, etc.

$125.00
$125.00

Detectors and Sources for THz and IR
Fedir F. Sizov
Materials Research Foundations Vol. 72
Publication Date 2020, 330 Pages
Print ISBN 978-1-64490-074-1 (release date May, 2020)
ePDF ISBN 978-1-64490-075-8
DOI: 10.21741/9781644900758

IR and THz technologies are widely used in security screening and surveillance, astronomy, spectroscopy, biomedicine, food and package inspection, detection of concealed weapons, vision through camouflage, etc. There are increasing demands for the fast transmission of large amounts of data. THz radiation penetrates dielectric materials like plastics, ceramics or cardboard allowing contact-free testing. Medical imaging technologies can provide guidance for surgeons in delimiting the margins of tumors, help clinicians to visualize diseased areas, etc.

Keywords
THz and IR Detectors, THz and IR Sources, Superconducting Photon Detectors, Superconducting THz Detectors, Graphene-based Detectors, THz Sensors with Metamaterials, Photoconductive Antenna Detectors, Imaging, Communication, Spectroscopy, Sensing, Security Screening, Surveillance, Astronomy, Biomedicine, Food Inspection, Package Inspection, Concealed Weapons Detection, Transmission of Large Amounts of Data, Non-destructive Testing, Contact-free Testing, Medical Imaging Technologies

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Table of Contents
Preface vi
Abbreviations viii
Chapter 1. Introduction (background) 1
Chapter 2. Brief history of THz and IR technologies 17
Chapter 3. Types of detectors and figures of merit 44
Chapter 4. IR and THz detection principles – direct and coherent detections 89
Chapter 5. Detectors 135
Ch. 6. THz and IR sources 266
Final remarks 313
Keyword Index 314
About the Author 320

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About the Author

Fedir Sizov, Head of Physics and Low Dimensional Structures Department, the Institute of Semiconductor Physics, National Academy of Sciences of Ukraine.

Nauki Av., 41, Kiev 03028, Ukraine, e-mail: sizov@isp.kiev.ua.

Sizov joined the Institute of Semiconductor Physics in 1970 as a postgraduate. He received the Ph.D. and Dr.Sc. degrees in 1975 and 1985, respectively, from the Ukrainian Academy of Sciences. F. Sizov is a Professor since 1988. He is the SPIE officer and EuMA member. He is an author or Editor of 5 books (mostly in Russian) and published more than 120 scientific papers in refereed journals. He was a Co-Chair and a Member of Program Committees of more than 20 International Conferences. He is the Ukrainian State Prize Winner and the Honored Worker of Science and Technology of Ukraine.

Sizov areas of interest include the physics of semiconductors, low-dimensional semiconductor systems, IR and THz physics.