Characterization of Nanomaterials: X-ray Diffraction Method, Electron Microscopy and Light Scattering

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Characterization of Nanomaterials: X-ray Diffraction Method, Electron Microscopy and Light Scattering

Bichitra Nandi Ganguly

This chapter reviews methods to illuminate the molecular architecture of nanoparticles through special high resolution techniques such as X-ray diffraction studies (XRD), which is used to examine the crystallinity of a sample, the powder diffraction method which assesses the size of the nano crystalline sample by Debye-Scherrer method. Transmission (TEM) and scanning electron microscopic (SEM) methods are used to get information on the structural morphology, elemental composition and size of the nanoparticles. Further, the dynamic light scattering (DLS) method gives an illustration of measurement of hydrodynamic radii of nanoparticles in its dispersed phase. These are some of the basic tools one needs to use for the physical characterization of nanoparticles. Some examples are also given in order to better understand the processes.

Keywords
X-Ray Diffraction, Debye Scherrer Method, Electron Microscopy, Light Scattering

Published online 7/1/2018, 19 pages

DOI: http://dx.doi.org/10.21741/9781945291739-5

Part of the book on Nanomaterials in Bio-Medical Applications

References
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