Stress Measurements of Coarse Grain Materials using Double Exposure Method with Hard Synchrotron X-Rays
K. Suzuki, T. Shobu, A. Shirodownload PDF
Abstract. The double exposure method (DEM) is proposed herein for X-ray stress measurement of coarse grain materials. A diffraction angle was obtained from an incident beam and a spotty diffracted beam. Each X-ray beam was measured by an area detector on a linear motion stage on a 2θ-arm. To verify the effectiveness of the DEM, the residual stress of a plastically bent specimen and the residual stress distribution of an indented specimen was measured. The results obtained with the DEM were similar to the results of simulations using the finite element method confirming that the DEM is useful for X-ray stress measurements of coarse grain materials.
X-Ray Stress Measurement, Coarse Grain, Double Exposure Method, Hard Synchrotron X-Ray
Published online 9/11/2018, 6 pages
Copyright © 2018 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA
Citation: K. Suzuki, T. Shobu, A. Shiro, ‘Stress Measurements of Coarse Grain Materials using Double Exposure Method with Hard Synchrotron X-Rays’, Materials Research Proceedings, Vol. 6, pp 69-74, 2018
The article was published as article 12 of the book Residual Stresses 2018
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