Single Tilt Method for Residual Stress Evaluation with 2D Detectors

Single Tilt Method for Residual Stress Evaluation with 2D Detectors

B.B. He

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Abstract. When X-ray diffraction is used for residual stress measurement, high 2θ peaks are typically used for enhanced 2θ shift and better tolerance to the sample height error. But for thin films, coatings, or polymer materials, high 2θ peaks may not be available or appropriate for stress measurement. As a result of large angular coverage with a 2D detector, residual stress can be measured with a single tilt angle. The diffraction vector coverage from low 2θ angle diffraction ring can satisfy the stress or stress tensor measurement at a single tilt angle. The single tilt method can avoid the sample height error caused by changing the tilt angle, which is especially critical when measuring stress with a low 2θ peak. Another advantage is the consistent depth of penetration due to a constant incident angle, which is especially suitable for residual stress measurement on coatings, thin films or samples with steep stress gradient. This paper introduces the single tilt method for stress evaluation with two-dimensional detectors, including experimental examples on coatings and polymers.

2D Detector, Residual Stress, Coating, Thin Films, Polymer

Published online 9/11/2018, 6 pages
Copyright © 2018 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA

Citation: B.B. He, ‘Single Tilt Method for Residual Stress Evaluation with 2D Detectors’, Materials Research Proceedings, Vol. 6, pp 3-8, 2018


The article was published as article 1 of the book Residual Stresses 2018

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