Comparison of Residual Stress Measurement Techniques and Implementation Using X-Ray Diffraction
M. Belassel, J. Pineault, N. Caratanasov, M. Braussdownload PDF
Abstract. Regardless of the particular residual stress (RS) measurement technique being used, all are based on the same basic principles when using x-ray diffraction (XRD). Every technique has both its advantages and disadvantages, many of which are well known to engineers and scientists however, some of the important “finer points” are unfortunately not widely discussed or known by those not well versed in the subject. This paper will try to bring to light many of these commonly misunderstood issues by comparing the different techniques and attempt to illuminate the associated problems a user may encounter when measurements become challenging i.e. when RS measurements are to be performed in tight grooves or on textured materials for example. In this study, different techniques including the: Cos technique, MET (used in Psi, Omega, or Modified Psi mode) have been evaluated and tested on a variety of materials and geometries.
Residual Stress, X-Ray Diffraction, Measurement Technique, Geometry
Published online 12/22/2016, 6 pages
Copyright © 2016 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA
Citation: M. Belassel, J. Pineault, N. Caratanasov, M. Brauss, ‘Comparison of Residual Stress Measurement Techniques and Implementation Using X-Ray Diffraction’, Materials Research Proceedings, Vol. 2, pp 43-48, 2017
The article was published as article 8 of the book Residual Stresses 2016
Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
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