Electronic Bonding Analysis on Dilute Doping of Iron in Nickel Oxide Nano Crystals
K. S. Arjun, S. Saravanakumar, M. Prema Rani
The electronic bonding of Ni1-xFexO (x=0.00, 0.01, 0.02) nanocrystalline powders was analyzed using MEM (Maximum Entropy Method). All the samples were prepared using the chemical co-precipitation method. X-ray diffraction (XRD), UV absorption spectroscopy and Vibration Sample Magnetometer (VSM) measurements were performed to study the crystal structure, optical bang gap and magnetic properties of the prepared samples. The X-ray data were refined using the Rietveld refinement. Using one, two and three dimensional MEM maps, the bonding within the atoms was evaluated.
X-Ray Diffraction, Rietveld Refinement, Band Gap, Maximum Entropy Method
Published online 6/1/2016, 12 pages
Part of Novel Ceramic Materials
 S. A. Wolf, D. DAwschalom, R.A. Buhrman, J.M. Daughton, S. Von Molnar, M.L. Roukes, A.Y. Chtchelkanova and D. M. Treger, Spintronics: a spin-based electronics vision for the future, Science 294 (2001) 1488-95.
 T. Dietl, H. Ohno, F. Matsukura, J. Cibert and D. Ferrand, Zener model description of ferromagnetism in zinc-blende magnetic semiconductors, Science 287 (2000) 1019-22.
 Yi-Dong Luo, Yuan-HuaLin, Xuehui Zhang, Deping Liu, Yang Shen, and Ce-Wen Nan, Ferromagnetic Behaviors in Fe-Doped NiO Nanofibers Synthesized by Electrospinning Method, Journal of Nanomaterials, 2 (2013) 525-93.
 H.M. Rietveld, A profile refinement method for nuclear and magnetic structures, J. Appl. Crystallogr. 2 (1969) 65-71.
 V. Petrˇıcˇek, M. Dusˇek, L. Palatinus, in: JANA2000, The Crystallographic Computing System, Institute of Physics, Academy of Sciences of the Czech Republic, Praha, 2000.
 A. D. Ruben, I. Fujio: Super-fast Program PRIMA for the Maximum-Entropy Method, Advanced materials Laboratory, National Institute for Materials Science, Ibaraki, Japan p. 305 (2004) 0044.
 F.Izumi, R.A. Dilanian: Recent Research Developments in Physics, Part II, 3, Transworld, Research Network, Trivandrum, 2002, pp. 699–726.
 K. Momma, F. Izumi, VESTA: a three-dimensional visualization system for electronic and structural analysis, J. Appl. Crystallogr. 41 (2008) 653.