Quartz PCI is the preferred image acquisition and archiving solution of thousands of researchers around the world. PCI helps you manage all aspects of the imaging process including acquisition, annotation, archiving and retrieval.
Specialized modules are available for acquisition from SEMs, STEMs, TEMs, light microscopes, video sources, TWAIN devices and virtually any other kind of imaging instrument.
Quartz PCI Slow-Scan acquires high-resolution, slow-scan images from any manufacturer’s SEM and STEM instruments without interfering in any way with normal microscope operation.
Digital Image Acquisition and Processing
Automatic Measurement for X-SEM Images
X-Ray Microanalysis Systems EDX
Laboratory Information Management Systems LIMS
Instrument Access Control and Scheduling
Remote Control for Microscopes
SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 61 countries.
SPIP™ supports 104 file formats for various instrument types, including:
SPM, AFM, STM
Bruker Nano Analytics presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes.
With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.
Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.
Besides this unparalleled range of analytical tools for electron microscopes (EM), Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.
As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers to you innovative high-performance technology. With our worldwide network of service centers and application specialists we are always close to your analytical needs.
EM Analyzers: Advancing Materials Characterization in EM
Micro-XRF and TXRF: Elemental Analysis in Research and Industry
Leica Microsystems develops and manufactures microscopes and scientific instruments for the analysis of microstructures and nanostructures. Widely recognized for optical precision and innovative technology, the company is one of the market leaders in compound and stereo microscopy, digital microscopy, confocal laser scanning and super-resolution microscopy with related imaging systems, electron microscopy sample preparation, and surgical microscopy.
Users of Leica Microsystems’ instruments and services can be found in many disciplines associated with material sciences, the manufacturing industry, and forensics services as well as in classrooms around the world. Instruments and workflow solutions for electron microscopy sample preparation complete the company’s product portfolio.
Leica Microsystems has seven major plants and product development sites located in Wetzlar and Mannheim (Germany), Vienna (Austria), Heerbrugg (Switzerland), Cambridge (UK), Shanghai (China), and Singapore. The company is represented in over 100 countries, has sales and service organizations in 20 countries, and an international network of distribution partners. Its headquarters are located in Wetzlar, Germany. Leica Microsystems is part of Danaher.
Product Categories include:
Stereo Microscopes & Macroscopes
Optical Coherence Tomography OCT
EM Sample Preparation
Microscope Objective & Leitz OEM Optics
Scienta Omicron, brings together the two leading innovators in Surface Science the former VG Scienta and Omicron NanoTechnology. This exciting venture creates new capabilities for the research community by the technology leaders in electron spectroscopy, scanning probe microscopy and thin film deposition. These capabilities are now available in custom tailored systems from one source with sales and service groups located in all major markets around the world.
To help serve customers in the most favorable way, the merger of VG Scienta and Omicron NanoTechnology will create two separate business units: Scienta Omicron will provide customized solutions and advanced technologies for fundamental research in surface science and nanotechnology. VACGEN will provide UHV components and supply chain solutions to system builders, OEMs and end-users.
We encourage you to contact your existing sales representative with any questions you may have. In the meantime, we assure you of our continued commitment to help you achieve your research objectives.
Scanning Probe Microscopy
El-Mul Technologies is an innovative and experienced solution provider and OEM manufacturer of in-vacuum charged particle detection systems and devices.
With over 20 years of experience, El-Mul is recognized for its ground-breaking products, world-class quality standards and dedicated service.
El-Mul’s products are specially designed for advanced analytical SEM/TEM systems, focused ion beam (FIB) tools, inspection and metrology semiconductor e-beam tools, mass spectrometry and other vacuum systems
Nanonics Imaging Ltd has developed a unique and highly differentiated product portfolio in the area of Scanning Probe Microscopy (SPM). Over the last two decades its products have stood at the forefront of technology providing answers for a wide range of nanotechnological applications unavailable with other measurement tools.
In this area of SPM, Nanonics Imaging is one of the most innovative companies in the world and this innovation together with unparalleled customer support and collaboration has been the basis of its growth. Today Nanonics has 45 employees in its Jerusalem headquarters and representatives throughout the world.
Nanonics Imaging Ltd. was the first to realize that the integration of scanning probe microscopes with other standard techniques, such as optical microscopy, Raman microprobes, scanning electron microscopes and ion beam microscopes, would introduce critical added value to many of these measurement tools. Thus, its products were developed with such integration in mind and in a variety of these areas it was the first to market such products. It presently has singular and leading offerings in each of these areas.
Furthermore, Nanonics Imaging effectively overcame barriers that had prevented introduction of scanning multi probe microscopes, SPM systems with more than one probe. It was the first company and is still the only company to have a general multiprobe SPM solution including all forms of SPM measurements such as electrical, thermal, optical, mechanical etc.
In addition to the above, a central development of the Company is a novel form of optical microscopy invented by the Founder of Nanonics Imaging, Aaron Lewis. This technique is called Near-Field Scanning Optical Microscopy (NSOM) and Nanonics is a leader in this field worldwide. NSOM is being increasingly recognized as being critical in advancing areas of nano optics and in characterizing plasmonic and photonic devices, optical circuits, advanced opto-electronic components, silicon waveguides and devices and photonic band gap materials and devices.
These nano-optical measurement capabilities even extend to electron and ion beam instrumentation and this has brought super-resolution optical imaging to such areas as cathodoluminescence which have been limited in resolution by far-field optical methods.
In each area of its product offerings Nanonics Imaging has won numerous awards over the years. These awards cover all areas of microscopic innovation including Raman microprobe integration, multiprobe development, unparalleled scanner advances, forefront probe technologies etc. The company has collaborated with numerous companies such as Renishaw Plc, FEI etc providing SPM solutions that transform the offerings of these partners and allow them to reach new nanotechnological horizons.
In parallel Nanonics also has evolved a NanoTool KitTM of probes that are both multiprobe friendly and do not obscure the optical or the electron/ion optical axis of the microscope. This NanoToolKitTM includes optical, electrical, thermal and even probes providing nanovacuum and nanochemical writing capabilities. These latter probes allow for a unique methodology called NanoFountain Pen Nanochemistry which even permits nanochemical lithography on any surface and with any ink including inks that are gaseous reagents.
With its NanoToolKitTM and its highly differentiated offerings of SPM systems, fully protected by a portfolio of patents, Nanonics has shown great potential to provide measurement capabilities that simply have been unachievable in the past. In essence, the Nanonics Imaging combination of products forms the basis of a variety of measurement technologies that are increasingly becoming an integral component in a penetrating nanotechnological revolution that stands at the forefront of present and future technological revolutions.
NSOM & SNOM SPM
Multiprobe AFM, NSOM & Raman
Low Temp AFM, NSOM & Raman
AFM SEM FIB
AFM &SPM Probes
Delmic B.V. is a company based in Delft, the Netherlands that produces correlative light and electron microscopy solutions. Currently, DELMIC produces three systems, the SECOM, a platform for integrated fluourescence and electron microscopy, the SPARC, a high-performance cathodolumiscence detection system, and the Delphi, the world’s first fully integrated fluourescence and scanning electron microscope and the product of a collaboration with Phenom-World. These systems are also accompanied by ODEMIS, open-source software designed to navigate the integrated microscopy systems and to optimize image overlay.
Delmic originated as a result of the development of the SECOM platform, an integrated fluorescence and scanning electron microscope which was conceived by Charged Particle Optics group of Delft University of Technology. At the end of 2011 the company obtained the SPARC system from the Photonic Materials Group group at AMOLF. At the International Microscopy Conference in 2014, DELMIC also launched the Delphi system, a tabletop correlative microscopy solution that, like SECOM, combines a scanning electron microscope with fluorescence microscopy.
The intuitive user interface of the Phenom electron microscope enables fast, high-quality SEM imaging with minimal training. You can discover the features of your sample by clicking on the areas of interest on the screen. The Phenom is equipped with an optical color microscope for a never lost sample navigation. Thanks to this function it is possible to swiftly navigate to any region of interest and keep the image overview of the sample. The Phenom is equipped with a long lifetime, high brightness thermionic source (CeB6), that enables high-resolution imaging up to 130,000x magnification.
Unlike other systems, both EDS detector and Elemental Analysis software are fully embedded into the Phenom, offering you advanced point & click element identification, confirmation and verification modes. Any sample can be placed easily into a specially designed sample holder. After loading the sample you receive an instant optical image and electron image in just 30 seconds. The Phenom is equipped with a computer controlled motorized X and Y stage, enabling any position on the sample to be imaged and analyzed.