Effect of Thermal and Mechanical Loadings on the Residual Stress Field in a Nickel Based Superalloy using X-Ray Laue Microdiffraction

Article PDF

Effect of Thermal and Mechanical Loadings on the Residual Stress Field in a Nickel Based Superalloy using X-Ray Laue Microdiffraction

G. Altinkurt, M. Fèvre, G. Geandier, O. Robach, S. Guernaoui, M. Dehmas

download PDF

Abstract. The shot-peening operation is used to improve the fatigue lifetime of mechanical components through the introduction of compressive residual stresses and plastic deformation in a surface layer. In this study, the Laue microdiffraction technique is used to investigate deviatoric strain fields caused by the shot-peening operation and their redistribution after fatigue testing in a nickel-based polycrystalline superalloy with a 40 µm average grain size.

Keywords
Laue Microdiffraction, Residual Deviatoric Strain, Shot-Peening, Fatigue, Coarse-Grained Crystal, Nickel Based Superalloy

Published online 12/22/2016, 6 pages
Copyright © 2016 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA

Citation: G. Altinkurt, M. Fèvre, G. Geandier, O. Robach, S. Guernaoui, M. Dehmas, ‘Effect of Thermal and Mechanical Loadings on the Residual Stress Field in a Nickel Based Superalloy using X-Ray Laue Microdiffraction’, Materials Research Proceedings, Vol. 2, pp 527-532, 2017

DOI: http://dx.doi.org/10.21741/9781945291173-89

The article was published as article 89 of the book Residual Stresses 2016

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.

References
[1] O.M.D.M. Messe, S. Stekovic, M.C. Hardy, C.M.F. Rae, Characterization of plastic deformation induced by shot-Peening in a Ni-Base superalloy, JOM 66 (2014) 2502-251. https://doi.org/10.1007/s11837-014-1184-8
[2] R. I. Barabash, E.W Huang, J.J. Wall, J.H. Wilkerson, Y. Ren, W. Liu, S.C. Vogel, G.E. Ice, L.M. Pike, P.K. Liaw, Texture crossover: Trace from multiple grains to a subgrain, Mater. Sci. Eng. A528 (2010) 3-10. https://doi.org/10.1016/j.msea.2010.07.035
[3] E.-W. Huang, R.I. Barabash, G.E. Ice, W.J. Liu, Y.-L. Liu, J.-J. Kai, P.K. Liaw, Cyclic-loading-induced accumulation of geometrically necessary dislocations near grain boundaries in an Ni-based superalloy, JOM 61-12 (2009) 53-58. https://doi.org/10.1007/s11837-009-0181-9
[4] O.M. Barabash, R.I. Barabash, G.E. Ice, Z.Feng, D. Gandy, X-ray microdiffraction and EBSD study of FSP induced structural/phase transitions in a Ni-based superalloy, Mater. Sci. Eng. A524 (2009) 10-19. https://doi.org/10.1016/j.msea.2009.03.086
[5] M.L. Suominen Fuller, R.J. Klassen, N.S. McIntyre, A.R. Gerson, S. Ramamurthy, P.J. King, W. Liu, Texture, residual strain, and plastic deformation around scratches in alloy 600 using synchrotron X-ray Laue micro-diffraction, J. Nucl. Mater. 374 (2008) 482-487. https://doi.org/10.1016/j.jnucmat.2007.10.015
[6] J. Chao, A. Mark, M.L. Suominen Fuller, N.S. McIntyre, R.A. Holt, R.J. Klassen, W.J. Liu, Study of residual elastic- and plastic-deformation in uniaxial tensile strained nickel-based Alloy 600 samples by polychromatic X-ray microdiffraction (PXM) and neutron diffraction methods, Mater. Sci. Eng. A524 (2009) 20-27. https://doi.org/10.1016/j.msea.2009.05.033
[7] J. Chao, M.L. Suominen Fuller, N. Sherry, J. Qin, N. Stewart McIntyre, J. Ulaganathan, A.G. Carcea, R.C. Newman, M. Kunz, N. Tamura, Plastic and elastic strains in short and long cracks in Alloy 600 studied by polychromatic X-ray microdiffraction and electron backscatter diffraction, Acta Mater. 60 (2012) 5508-5515. https://doi.org/10.1016/j.actamat.2012.06.060
[8] S.T. Wlodek, M. Kelly, D. Alden, The Structure of N18, Proceedings of Superalloys 1992 (1992) 467-476. https://doi.org/10.7449/1992/superalloys_1992_467_476
[9] O. Ulrich, X. Biquard, P. Bleuet, O. Geaymond, P. Gergaud, J.S. Micha, O. Robach, F. Rieutord, A new white beam x-ray microdiffraction setup on the BM32 beamline at the Europea Synchrotron Radiation Facility, Rev. Sci. Instr. 82 (2011) 033909-1-6. https://doi.org/10.1063/1.3555068
[10] J. Chung, G. Ice, Automated indexing for texture and strain measurement with broad-bandpass X-ray microbeams, J. Appl. Phys. 86 (1999) 5249-5255. https://doi.org/10.1063/1.371507
[11] N. Tamura, A. A. MacDowell, R. Spolenak, B. C. Valek, J. C. Bravman, W. L. Brown, R. S. Celestre, H. A. Padmore, B. W. Batterman, J. R.J. Patel, Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films, Synchrotron. Radiat. 10 (2003) 137-143. https://doi.org/10.1107/S0909049502021362
[12] Information on https://sourceforge.net/projects/lauetools/
[13] F. Hofmann, S. Eve, J. Belnoue, J.S. Micha, A. M. Korsunsky, Analysis of strain error sources in micro-beam Laue diffraction, Nuclear Instrum. Methods Phys. Res. A660 (2011) 130-137. https://doi.org/10.1016/j.nima.2011.09.009