How Precise can be the Residual Stress Determined by X-Ray Diffraction? A summary of the Possibilities and Limits

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How Precise can be the Residual Stress Determined by X-Ray Diffraction? A summary of the Possibilities and Limits

E. Mueller

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Abstract. Many springs are shot peened and the quality of shot peening is essential for the fatigue life. Today the determination is often done via x-ray diffraction. The lattice distance is measured and out of this information the residual stress is determined (and not directly measured). For this kind of measurement an absolute measurement is not available. The only way is to calibrate it in some way. It is shown how precise measurements today are in relation to different x-ray diffractometers and a specimen must be designed to get something like a usable calibration sample. The difference between statistical and systematic errors is shown and the consequences of these errors are discussed.

Keywords
Calibration, Residual Stress Measurements, Round Robin Tests

Published online 12/22/2016, 4 pages
Copyright © 2016 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA

Citation: E. Mueller, ‘How Precise can be the Residual Stress Determined by X-Ray Diffraction? A summary of the Possibilities and Limits’, Materials Research Proceedings, Vol. 2, pp 295-298, 2017

DOI: http://dx.doi.org/10.21741/9781945291173-50

The article was published as article 50 of the book Residual Stresses 2016

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.

References
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