Residual Stress Redistribution due to Removal of Material Layers by Electrolytic Polishing
I. Surtee, J.P. Nobredownload PDF
Abstract. The phenomenon of redistribution of residual stress due to the removal of material layers by electrolytic polishing can be attributed to the disturbance in the initial equilibrium state of the stress caused by the material removal, which must be considered when this technique is used together with X-ray diffraction for residual stress determination. This study investigates these redistributions and involves the development of a numerical simulation model on the ANSYS finite element platform, in which different material removal cases were simulated on a flat plate model. The cases simulated and compared includes the removal of complete layers in incremental depths, the removal of strip layers in incremental widths and depths as well as the removal of square sections in incremental sizes and depths. The main objective deals with the effect of removal depth for the full layer removal and the effect of plate geometry for the square and strip removal models. A mathematical correction technique that was shown to correct the redistributions within minimal limits for the square layer removal process is proposed. Moore and Evans correction as well as Pederson-Hanson correction techniques are currently being used, but both methods are not unique to square section removal corrections and were used for model validation. The correction proposed displayed promising results when applied to simulated data, but lacked enough data and experimental validation to be generalized. The findings show a lot of insight into the redistribution patterns of these stresses as well as the different parameters that affect their behavior.
Electrolytic Polishing, Residual Stresses, X-Ray Diffraction
Published online 12/22/2016, 6 pages
Copyright © 2016 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA
Citation: I. Surtee, J.P. Nobre, ‘Residual Stress Redistribution due to Removal of Material Layers by Electrolytic Polishing’, Materials Research Proceedings, Vol. 2, pp 593-598, 2017
The article was published as article 100 of the book Residual Stresses 2016
Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
 Handbook of Measurement of Residual Stresses, Society for Experimental Mechanics (SEM), Edited by J. Lu, 1996, pp. 5-34/71-131.
 E. Macherauch und P. Müller, Das sin2-Verfahren der Röntgenographischen Spannungsmessung, Zeitschrift für Angewandte Physik 13 (1961) 305-312.
 M. Moore and W. Evans, Mathematical Correction for Stress in Removed Layers in X-Ray Diffraction Residual Stress Analysis, SAE Technical Paper 580035 (1958).
 I.L. Hansson and T.F. Pedersen, Finite element calculations for correction of residual stress profiles of coated and uncoated materials measured by X ray diffraction, NDT 22 (1989) 347-352.
 V. Savaria, F. Bridier and P. Bocher, Computational quantification and correction of the errors induced by layer removal for subsurface residual stress measurements, Int. J. of Mech. Sci. 64 (2012) 184-195. http://dx.doi.org/10.1016/j.ijmecsci.2012.07.003
 ANSYS, 2010, ANSYS Advanced Analysis Techniques, SAS IP, Inc., Houston.
 R. F. Laubscher, Gary Styger, Residual stress depth profiling by layer removal, 9th South African Conference on Computational and Applied Mechanics, 2014.