Nano Semiconducting Materials

$100.00$125.00

by Dr. R. Saravanan

The main focus of the present book is the characterization of a number of nano-semiconducting materials, using such techniques as powder X-ray diffraction, UV-visible spectrophotometry, Raman spectrometry, scanning electron microscopy, transmission electron microscopy and vibrating sample magnetometry. The materials studied include ZnS, TiO2, NiO, Ga doped ZnO, Mn doped SnO2, Mn doped CeO2 and Mn doped ZrO2.

$125.00
$100.00

Nano Semiconducting Materials
by Dr. R. Saravanan
Materials Research Foundations
Volume 3 (2016)
Print ISBN 978-1-945291-04-3
ePDF ISBN 978-1-945291-05-0
DOI: http://dx.doi.org/10.21741/9781945291050

Due to their unique optical, thermal, catalytic, magnetic and electronic properties, nano semiconducting materials have a huge potential in a great number of technological applications, ranging from photovoltaics and photocatalysis to biosensors and medicine. In the last couple of decades, the synthesis and characterization of these materials has been of key interest not only to materials scientists but also to researchers working in the field of physics, chemistry, molecular biology and medicine.

The main focus of the present book is the characterization of a number of nano semiconducting materials, using such techniques as powder X-ray diffraction, UV-visible spectrophotometry, Raman spectrometry, scanning electron microscopy, transmission electron microscopy and vibrating sample magnetometry. The materials studied include ZnS, TiO2, NiO, Ga doped ZnO, Mn doped SnO2, Mn doped CeO2 and Mn doped ZrO2.

Of special interest has been the analysis of the electron density distribution within the nano samples. The results give deep insights into the atomic structures on which these crystals are based and on the binding characteristics between the atoms and the ways in which these characteristics can be changed. As the decisive properties of these materials depend upon the electron density distributions and their variations due to sample preparation specifics, temperature and the presence of doping elements, these results give important hints on the direction in which further research should be directed.

Keywords
Nano Semiconducting Materials, Semiconductor, Characterization, Powder X-Ray Diffraction, UV-Visible Spectrophotometry, Raman Spectrometry, Scanning Electron Microscopy, Transmission Electron Microscopy and Vibrating Sample Magnetometry, ZnS, TiO2, NiO, Ga doped ZnO, Mn doped SnO2, Mn doped CeO2 and Mn doped ZrO2.

Contents
Preface
Chapter 1 An Introduction 1
Chapter 2 Sample Preparation & X-Ray Analysis of Nano Semiconductors 44
Chapter 3 Size Analysis of Nano Semiconductors 82
Chapter 4 Optical Properties of Nano Semiconductors 103
Chapter 5 Electron Density Analysis of Nano Semiconductors 117
Chapter 6 Conclusions 165
Keywords 169
About the author 171

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ProtoView by Ringgold Clean Data
Saravanan presents the results of experimental X-ray studies of electron density distribution in a number of promising semiconducting material in both nano-particle and nano-wire form. Electron density analysis on nano semiconducting materials provides information about their physical and chemical properties, he says, but has not been performed on several new species. He discusses sample preparation and X-ray analysis of nano semiconductors, size analysis, optical properties, and electron density analysis. Annotation ©2017 Ringgold Inc. Portland, OR (protoview.com)
Ringgold Keywords
Nano semiconductors, Novel materials, Electronics, Electron density analysis, X-ray analysis

About the Author

Dr Ramachandran Saravanan, has been associated with the Department of Physics, The Madura College, affiliated with the Madurai Kamaraj University, Madurai, Tamil Nadu, India from the year 2000. He is the head of the Research Centre and PG department of Physics. He worked as a research associate during 1998 at the Institute of Materials Research, Tohoku University, Sendai, Japan and then as a visiting researcher at Centre for Interdisciplinary Research, Tohoku University, Sendai, Japan up to 2000.

Earlier, he was awarded the Senior Research Fellowship by CSIR, New Delhi, India, during Mar. 1991 – Feb.1993; awarded Research Associateship by CSIR, New Delhi, during 1994 – 1997. Then, he was awarded a Research Associateship again by CSIR, New Delhi, during 1997- 1998. Later he was awarded the Matsumae International Foundation Fellowship in1998 (Japan) for doing research at a Japanese Research Institute (not availed by him due to the simultaneous occurrence of other Japanese employment).

He has guided six Ph.D. scholars as of 2016, and about ten researchers are working under his guidance on various research topics in materials science, crystallography and condensed matter physics. He has published around 100 research articles in reputed Journals, mostly International, apart from around 45 presentations in conferences, seminars and symposia. He has also guided around 50 M.Phil. scholars and an equal number of PG students for their projects. He has attracted government funding in India, in the form of Research Projects. He has completed two CSIR (Council of Scientific and Industrial Research, Govt. of India), one UGC (University Grants Commission, India) and one DRDO (Defense Research and Development Organization, India) research projects successfully and is proposing various projects to Government funding agencies like CSIR, UGC and DST.

He has written 3 books in the form of research monographs with details as follows; “Experimental Charge Density – Semiconductors, oxides and fluorides” (ISBN-13: 978-3-8383-8816-8; ISBN-10:3-8383-8816-X), “Experimental Charge Density – Dilute Magnetic Semiconducting (DMS) materials” (ISBN-13: 978-3-8383-9666-8; ISBN-10: 3-8383-9666-9) and “Metal and Alloy Bonding – An Experimental Analysis” (ISBN -13: 978-1-4471-2203-6). He has committed to write several books in the near future.

His expertise includes various experimental activities in crystal growth, materials science, crystallographic, condensed matter physics techniques and tools as in slow evaporation, gel, high temperature melt growth, Bridgman methods, CZ Growth, high vacuum sealing etc. He and his group are familiar with various equipment such as: different types of cameras; Laue, oscillation, powder, precession cameras; Manual 4-circle X-ray diffractometer, Rigaku 4-circle automatic single crystal diffractometer, AFC-5R and AFC-7R automatic single crystal diffractometers, CAD-4 automatic single crystal diffractometer, crystal pulling instruments, and other crystallographic, material science related instruments. He and his group have sound computational capabilities on different types of computers such as: IBM – PC, Cyber180/830A – Mainframe, SX-4 Supercomputing system – Mainframe. He is familiar with various kind of software related to crystallography and materials science. He has written many computer software programs himself as well. Around twenty of his programs (both DOS and GUI versions) have been included in the SINCRIS software database of the International Union of Crystallography.