scanning probe microscope
IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).
The IONTOF group of companies develops, sells, manufactures and supports
innovative instruments for surface analysis.
With more than 75 employees working in Germany, the United States of America and Switzerland, IONTOF is seen as role model for the successful development of original university research into a professional business.
IONTOF’s mission is to develop surface analysis technology and expand its potential for future applications. Considerable research effort as well as close co-operation with our customers will create new possibilities, thus keeping our instruments at the leading edge of technology.
IONTOF’s success is based on the longstanding experience in the field and the skills of our scientists and engineers. Excellent customer support and the close co-operation with them, and a dedication to supply a good, efficient product to match the demands of the modern users are part of our nature.
The IONTOF sales team aims at helping and supporting our potential customers to find the best solution for their specific problems.
Time-of-flight secondary ion mass spectrometers (TOF-SIMS)
High-sensitivity low energy ion scattering (LEIS)
High-end vacuum scanning probe microscope (SPM)
For more detail please visit our homepage or contact us under email@example.com, we are looking forward discussing your research questions with you.