icroscopy (SEM)

15 Tech Valley Drive, East Greenbush, NY 12061, USA

X-Ray Optical Systems, known as XOS, is a leading manufacturer of application-specific X-ray analyzers, offering elemental analysis solutions that improve public safety and customer efficiency in industries like petroleum, consumer products, and environmental compliance. For petroleum applications, XOS offers portable, lab, and process analyzers with unrivaled precision at the push of a button. XOS also offers High Definition XRF (HDXRF©) analyzers for the detection of toxic elements in consumer products, such as toys and apparel and areas of environmental regulation, like soil and water. XOS’s advanced optics and OEM sub-systems can increase precision, speed, and spatial resolution, while decreasing the size, complexity, and cost of the instrument.
Advanced X-ray optics can often increase the sensitivity of the measurements by more than a factor of 100, while decreasing the measurement time, increasing spatial resolution, and decreasing the size and cost of the equipment.
XOS has established its national and international presence by partnering with well-established manufacturers; and also through established distribution partners who are the most experienced and respected in the relevant markets. Using this strategy, XOS has penetrated the most important international markets and the most respected companies in Europe and Asia, to become a dominant supplier of this technology in the world.
Instrument designers call on XOS expertise in X-ray optics, systems, and application engineering, from design simulation and rapid prototyping, to complete analytical engine design.
End users implement XOS analyzers to drive yield and throughput improvements, meet strict regulatory requirements, and enhance product quality. These application-specific analyzers incorporate peak detection performance, low maintenance, and user-friendly operation in laboratory, at-line, on-line, and in-situ environments.

X-Ray Fluorescence (XRF)
X-Ray Fluorescence in Scanning Electron Microscopy (SEM)
X-Ray Diffraction (XRD)