X-Ray Analytical Techniques
AdSem, Inc. is a privately held company established in Palo Alto, CA by a group of highly experienced professionals with outstanding achievements in Semiconductors, Radiation Physics, and Material Science.
Our mission is development and production of novel semiconductor materials, advanced semiconductor devices and unique analytical instrumentation for semiconductor, nuclear, and cryogenic industries.
AdSem is the only company in the world that has developed and produce thermistors for any temperature between 1mK and 500ºC.
Our unique semiconductor NTC thermistors measure temperature of everything and everywhere: in-vivo brain and low- temperature radiometers, semiconductor chips and rocket engines.
AdSem is the only company in the world that offers Ge and Si high reflective mosaic monochromators for slow neutrons, gamma – and X-rays. Our mosaic monochromators have neutron reflectivity higher than any other neutron monochromators .
AdSem has invented and developed high temperature Silicon and Germanium NTC thermistors as well as an industrial technology for their production. AdSem opens a new era in temperature sensing industry by bringing up semiconductor technology into the 70-years old market of ceramic NTC thermistors.
There are fundamental scientific reasons for new Si and Ge thermistors to be the most sensitive and
highly interchangeable over working temperature range.
Their features also are:
Widest temperature range;
Micron Form Factor;
Reproducibility of production technology;
Utilization of microelectronic technology & packaging techniques
New doping technology of Ge and Si, developed by AdSem, allows producing unique low-temperature thermistors with wider operating temperature than any cryogenic thermistors, higher sensitivity in any selected temperature range down to 1mK, higher interchangeability at low- and ultra – low temperature and lower price.
For Neutron and X-ray Optics we developed superior technology for production of large Ge and Si mosaic crystalline monochromators. Our monochromators provide the high reflectivity for slow neutrons, gamma-rays and/or X-rays and any mosaicity value up to 1 arc degree.
The areas of our expertise and new development are also:
Novel PTC & NTC semiconductor thermistors with extended working temperatures;
High resistivity silicon;
Radiation technology and neutron transmutation doping of semiconductors;
Novel nuclear methods for non-destructive selection of high quality large crystals;
Advanced semiconductor nuclear detectors;
Advanced Research Systems, Inc. was started in 1986 by Ravi Bains to provide cryogenic solutions for low temperature research. ARS has evolved as a world class manufacturer of closed cycle cryocoolers and laboratory cryogenic systems. ARS is the only major supplier of laboratory cryostats that also manufactures 4 K closed cycle cryocoolers for its use.
Manufacturing our own cryocoolers allows us to seamlessly adapt our cryostats for challenging applications where the cryocooler must be customized for a specific application. ARS has sales and service capabilities worldwide, with an international sales force that is well trained to support our customers and provide guidance in the selection of cryogenic equipment that suits customers’ needs at a fair price.
We recognize that the quality of both our product and our customer relationships determines our future success in this competitive world. To facilitate this, we continue to invest in improving and expanding our capabilities and in developing new products for the future. We feel that the close working relationships we have forged with our customers over the years are testimony to our success.
Helium Flow Cryostats
Sample in Vacuum Cryostats
Sample in Vapor Cryostats
Ultra Low Vibration Cryostats
ICEFLY Cryogenic Delivery System
Scanning Tunneling Microscopy
Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields. Angstrom Advanced scientific instruments and gas plants have been delivered to many renowned organizations. Angstrom Advanced goal is to provide our customers with the best products with highest standard of service at cost efficient pricing.
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of ellipsometry instruments including Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers. Angstrom Advanced also offers IR Spectroscopic Ellipsometer. Angstrom Advanced offers Lab test services. Angstrom Advanced Ellipsometry models are:
Angstrom Advanced PHE101 Discrete Wavelength Ellipsometer
Angstrom Advanced PHE102 Spectroscopic Ellipsometer
Angstrom Advanced PHE103 Spectroscopic Ellipsometer
Angstrom Advanced PHE104 IR Spectroscopic Ellipsometer
Angstrom Advanced Product lines include:
Angstrom Advanced Nuclear Magnetic Resonance (NMR)/Magnetic Resonance Imaging (MRI)
Angstrom Advanced X-ray Diffractometer, X-ray Flaw Detector
Angstrom Advanced Lab Gas Generator(Nitrogen, Hydrogen, Air)
Angstrom Advanced Atomic Force Microscope/Scanning Electron Microscope
Angstrom Advanced Hydrogen Generating Plant
Angstrom Advanced Nitrogen Generating Plant
Angstrom Scientific Inc. is a distributor and manufacturer’s representative, focused on providing characterization solutions to the nanotech marketplace in the Americas. Companies represented:
Provides surface analysis solutions in a number of key application areas.
Deben manufactures innovative accessories for SEM’s and TEM’s, along with a large range of in-situ tensile testing stages for use with Optical Microscopes, X-Ray CT and XRD systems.
DENSsolution is a leading supplier of top quality sample management solutions to enable atomic resolution, dynamic in-situ electron microscopy.
Encapsulix addresses the geometric scaling of critical Atomic Layer Deposition (ALD) requirements for industrial & microelectronic devices and films. Initial process focus is in thin Al2O3, TiO2 and ZnO specifically for encapsulation and barrier coatings.
Hitachi Nanotechnology Systems Division:
Hitachi Nanotechnology Systems Division (NSD) supportscustomers with a wide range of instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.
Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology.
Kleindiek Nanotechnik offers a new level of precision in manipulation, probing, and characterization of nano-materials and semiconductors
Mel-Build provides a wide verity of specialized holders for Transmission Electron Microscopes.
Microtrac strives to provide the materials characterization world with innovative, reliable, and repeatable particle size, particle shape, particle charge, and surface area analysis instrumentation.
XEI Scientific, Inc.provides an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.
Since 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Rigaku and its subsidiaries form a global group focused on life sciences and general purpose analytical instrumentation, including Energy Dispersive X-ray Fluorescence (EDXRF). With hundreds of major innovations to its credit, Rigaku and its subsidiary companies are world leaders in the fields of small molecule and protein crystallography, X-ray fluorescence (XRF) and diffraction, X-ray optics, as well as semiconductor metrology. Rigaku employs over 1,100 people globally.
AXIC, Inc. was founded in 1980 as a company to develop surface science equipment for the semiconductor, electronics, and general scientific community. Initial developments focused on x-ray and electron beam analysis of surfaces for compositional and film thickness analysis. These developments lead to the introduction of a stand alone x-ray fluorescence unit which was easily operated by fab personnel for the measurement of film composition and thickness. AXIC, Inc. now produces 3 XRF systems for coatings analysis in both development and production applications for the semiconductor, magnetic, and superconductor industries.
In 1992, AXIC entered the market of producing laser based reflectometers for the measurement of film thickness, index of refraction, and film absorption properties of transparent/translucent films for the semiconductor, optical and magnetics industries.
Shortly after, AXIC commenced the manufacture of plasma tools for cleaning, photoresist stripping, reactive ion etch (RIE), and plasma enhanced chemical vapor deposition (PECVD). Today these offerings include the MultiMode HF8, PlasmaStar, and BenchMark 800-II. Units are ideally suited for research and development and small scale productions. The plasma tools can be configured in various ways to meet the end users’ specific requirements.
Baugh & Weedon is a leading manufacturer of Magnetic Particle Inspection (MPI) Benches and Liquid Penetrant Inspection (LPI) Penetrant Lines. Baugh & Weedon can also provide MT accessories including UV Lamps, dual UV and white light Inspection Lamps (Lumazon) and our dual UV and White Light Meter (LumaCheck) as well as a full range of MPI and LPI chemicals from Pfinder Chemie. You name it, we have it for all your Magnetic Particle Inspection and Liquid Penetrant Inspection needs.
Baugh & Weedon also have a wide range of Ultrasonic (UT) Thickness Gauges, EMAT Flaw Detectors, UT Flaw Detectors, Ultrasonic Wall Crawlers, Hollow Rail Axle Inspection Sytems, UT Immersion Tanks, Eddy Current (ECT) Sorting Bridges, Gamma Ray and X Ray Pipeline Crawlers.
Established in 1967, Baugh & Weedon has a long history of supplying the NDT industry with high quality products and services. Based in the UK and with a wealth of industry knowledge, we strive to be client focussed at all times, working with you to find the right solution for your NDT needs.
Products by Methods
Magnetic Particle Inspection MPI
Liquid Penetrant Inspection LPI
Magnetic Flux Leakage MFL
Beijing TIME High Technology Company is a testing instrument manufacturer, located in China. Our company is a wholly owned subsidiary of TIME Group Inc., founded in 1984. We have a long history of manufacturing portable hardness testers. In fact, we produced the first Leeb hardness tester in China. As a result of our focus on expanding our product range, we are now able to provide a wide range of products to perform many material test, measurement, and quality control tasks, including our portable hardness tester, surface roughness tester, ultrasonic thickness tester, and coating thickness tester. In addition, other products such as the ultrasonic flaw detector, X-ray generator, and concrete testing gauge are also available.
Portable Hardness Tester: Leeb Hardness Tester, Shore Durometer, Ultrasonic Hardness Tester
Ultrasonic Thickness Gauge
Coating Thickness Gauge
Ultrasonic Flaw Detector
Bench Hardness Tester: Vickers Hardness Tester, Rockwell Hardness Tester, Brinell Hardness Tester
Concrete Testing Gauge
Bruker Nano Analytics presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes.
With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.
Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.
Besides this unparalleled range of analytical tools for electron microscopes (EM), Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.
As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers to you innovative high-performance technology. With our worldwide network of service centers and application specialists we are always close to your analytical needs.
EM Analyzers: Advancing Materials Characterization in EM
Micro-XRF and TXRF: Elemental Analysis in Research and Industry
From its inception in 1929, CAMECA has been renowned for its precision mechanics, optics and electronics. The company started in France as a manufacturer of movie theater projectors, and soon the CAMECA products evolved into scientific instrumentation. Since pioneering Electron Probe MicroAnalysis (EPMA) in the 1950’s and Secondary Ion Mass Spectrometry (SIMS) in the 1960’s, CAMECA has remained the undisputed world leader in these techniques while achieving numerous breakthrough innovations in complementary techniques such as Low energy Electron induced X-ray Emission Spectrometry (LEXES), and 3D Atom Probe. CAMECA has evolved from a manufacturer of scientific instrumentation for the international research community to a provider of in-fab and near-fab metrology solutions for the semiconductor manufacturing industry.
Today, CAMECA employs over 300 employees around the world, with locations in the USA, Germany, Japan, Korea, China, and Taiwan, and a wide network of agents, ensuring the best level of support to all users. Our mission is to focus on instrumental development to offer our customers the highest analytical performance in their specialized characterization fields.
CAMECA is headquartered in Gennevilliers near Paris, France. Our plant is a state-of-the-art facility with clean room environment, electron and ion optics simulation, advanced CAD, UHV cleaning… Operating under ISO 9001 certification, CAMECA controls not only the technology, but all aspects in the designing, manufacturing, installing and servicing of its products.
In 2007, CAMECA joined AMETEK, Inc., a leading global provider of electronic instruments and electromechanical devices, as part of the AMETEK Materials Analysis Division.
Secondary Ion Mass Spectrometry SIMS & Nano-SIMS
Electron Probe MicroAnalysis EPMA
3D Atom Probe Microscope