Surface Engineering & Metrology

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AEP Technology. Santa Clara CA, USA
1900 Wyatt Dr., Suite 17, Santa Clara, CA 95054, USA
AEP is the world leader in surface metrology and technology innovation. From its inception it has developed cutting edge instruments to aid researchers and users. As the pioneers of innovation in hi tech engineering, it has grown steadily in worldwide markets. Currently it has offices in America, Asia and Europe.

AEP is the world leader in surface metrology and technology innovation. From its inception it has developed cutting edge instruments to aid researchers and users. As the pioneers of innovation in hi tech engineering, it has grown steadily in worldwide markets. Currently it has offices in America, Asia and Europe.
In addition to manufacturing optical profiler, interferometer and contact profilometer AEP also produces ex-situ and in-situ stress monitors for thin film deposition processes. Please contact us for any questions. Our team of scientists from silicon valley are always excited to answer your questions and help solve your problems.
Applications:
Step heights measurement
Surface Roughness measurement
Quantify scratch and dig features, wear depth, width and volume
Flatness or curvature measurement
2D thin film stress measurement
Film thickness
Surface Profiling – defect, features etc. depth, width and volume
Hardness
Wear Lubricity
Scratch
Roughness
Friction
Adhesion
Defectivity
Fatigue
Durability
Creep Cracks
Tensile
Stress
Indent
Delamination
Elasticity
Modulus

http://www.aeptechnology.com/
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AimSizer Scientific Ltd, Liaoning, China
No.32 Xingsan Road, Dandong 118000, Liaoning, China

AimSizer Scientific Ltd, a subsidiary of HMK Test, is China’s first specialized manufacturer and supplier of particle size analyzers, BET surface area analyzer, bulk density testers, lab sieve and milling products. AimSizer is an expert in particle characterization methods. 17 years’ development, research and production history strengthen us as leading place and enjoy a high reputation in the world particle characterization industry. We gather a team equipped with advanced technology and rich experience. All our particle characterization instruments are certified by China Research Institute of Test and Measurement in 1999 and got patented in the same year.

Products
Particle Size Analyzers
Fisher Sub-Sieve Sizer
BET Surface Area Analyzer
Bulk/Tap Density Testers
Scott Volumeters
Hall Flowmeters
Air Jet Sieve
Tablet Friability Tester
Plenatary Ball Mill
Rotary Sample Divider
Blaine Apparatus

www.aimsizer.com
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AJA International, Scituate MA, USA
809 Country Way, N Scituate MA, USA

AJA International, Inc. was founded in Scituate, Massachusetts, USA in 1989 by William Hale, MBA, BS Physics. The company was established as a supplier of innovative thin film, vacuum and microwave products.

Prior to founding AJA International, Mr. Hale developed numerous sputter systems, ECR systems, and worked extensively in RIE, PECVD, surface analysis and vacuum technology areas ranging from chemical/pharmaceutical to vacuum packaging to UHV/MBE. This experience along with a long experience in international business gave AJA International, Inc. a solid running start.

Within 2 years the company developed the popular ATC Series Sputtering Systems – the first commercial, con-focal, sputter tools with rotating substrates and in-situ tilting magnetron sputter heads. This revolutionary development yielded extremely uniform and controllable depositions of single layers, multi-layers and alloys and has become the most popular R&D sputtering system configuration on the market.

AJA sells its products directly or in cooperation with local agents. All AJA systems are installed by AJA factory personnel whenever possible and factory acceptance and training are highly recommended and welcomed. With over 900 systems and over 7,500 magnetrons shipped worldwide, AJA International, Inc. continues to discover innovative design solutions which are often copied but never equaled as the company truly remains THE CUTTING EDGE IN THIN FILM TECHNOLOGY.

Products
Sputtering Systems
Ion Mill Systems
Evaporation Systems
Multi-Technique Systems
Sputtering Sources
Substrate Holders
Sputtering Targets
Evaporation Materials

www.ajaint.com
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Alicona Corp., Bartlett IL, USA
1261 Humbracht Circle, Suite G, Bartlett, IL 60103, USA

We are a global supplier of optical 3D surface measurement solutions for quality assurance in the lab and in production. Our key competence is the measurement of form and roughness of even complex, miniaturized geometries. With Focus-Variation, our key technology, we offer a technique that combines the functionalities of a micro coordinate measurement machine (CMM) with those of a surface measurement system. For a user, this means to measure both form and roughness of component. The stable and robust technology of Focus-Variation delivers repeatable and traceable measurements even in a production near environment.
Our product range includes a number of standard as well as special solutions. Research and Development acts very close to the direct need of industry, which enables us to design both standard products as well as special solutions based on industrial partnerships.
The Alicona headquarters is situated in Austria. Additional subsidiaries are run in Germany, France, UK, USA, South Korea and Italy, and further expansion is continued. A global network of selected distributors make Alicona products worldwide available.

http://www.alicona.com
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Alicona Imaging GmbH, Graz, Austria
Dr.-Auner-Straße 21a, 8074 Raaba, Graz, Austria

We are a global supplier of optical 3D surface measurement solutions for quality assurance in the lab and in production. Our key competence is the measurement of form and roughness of even complex, miniaturized geometries. With Focus-Variation, our key technology, we offer a technique that combines the functionalities of a micro coordinate measurement machine (CMM) with those of a surface measurement system. For a user, this means to measure both form and roughness of component. The stable and robust technology of Focus-Variation delivers repeatable and traceable measurements even in a production near environment.
Our product range includes a number of standard as well as special solutions. Research and Development acts very close to the direct need of industry, which enables us to design both standard products as well as special solutions based on industrial partnerships.
The Alicona headquarters is situated in Austria. Additional subsidiaries are run in Germany, France, UK, USA, South Korea and Italy, and further expansion is continued. A global network of selected distributors make Alicona products worldwide available.

http://www.alicona.com/
Anatech, Hayward CA, USA
30695 Huntwood Ave, Hayward, CA 94544, USA

Anatech USA’s mission is to provide technical solutions for surface engineering challenges.
Anatech USA delivers high vacuum systems with graphic state-of-the-art, “Touch-Panel” intuitive control packages. Every effort is made to tailor the system to meet your needs and budget requirements.
Thin Film Deposition equipment for metals and dielectrics, using Planar Magnetron sources powered by DC and/or RF supplies. Electron Beam and Thermal Resistance source systems are also available.
Gas Plasma vacuum systems with quartz or aluminum chambers. Systems are designed to clean at the molecular level, activate surfaces or etch surfaces.
Anatech USA works to deliver systems with consistent value and quality that meet or exceed our customer’s expectations.

http://www.anatechusa.com
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Angstrom Sun Technologies, Boston MA, USA
31 Nagog Park, Acton, MA 01720, USA

Angstrom Sun Technologies Inc. is a privately held company, headquartered in Boston, USA. The focus of company is to provide a series of cost-effective optical solutions for characterizing thin film thickness, thick coating thickness, their optical properties (refractive index N and extinction coefficient K), surface and interface behavior, alloy concentrations and their uniformities across surface.
Affordable, low cost, but advanced and high performance tools, including spectroscopic reflectometer, microspectrophotometer, microreflectometer, film thickness mapping system, simple desktop film thickness station, and automatic variable angle spectroscopic ellipsometers, offer a way to probe film stacks nondestructively and precisely. In addition, Angstrom Sun Technologies Inc. also delivers advanced analytical services for characterizing thin films, thick coatings and complicated layer stacks.
Angstrom Sun Technologies Inc. designs and manufactures all TFProbe tools in a facility located in Boston, USA. TFProbe tools are sold and distributed by international sales networks.
With performance and professional support as our mission, Angstrom has established a worldwide customer base since 2002, including well-known education institutions, government agencies and Fortune 500 companies, such as NASA Marshall Space Flight Center, National Institute of Standards and Technology, Massachusetts Institute of Technology (MIT), Seoul National University, NanoTech Center (CESTM) at SUNY, Columbia University, Hewlett-Packard Co., Lockheed Martin Co., General Electric (GE), Corning Inc., Bell Laboratories, Johnson-Johnson, Mylan Technologies, Applied Materials (AMAT), Lam Research, Samsung Advanced Institute of Technology(SAIT), and MIT Lincoln Laboratory.

Products:
Spectroscopic Reflectometers
Spectroscopic Ellipsometers
Microspectrophotometers
Thin Film Mapping Systems
Integrated In-line Metrology
TFProbe Software
Accessories

http://www.angstec.com/
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Ansgtrom Scientific, Ramsey NJ, USA
PO Box 663, Ramsey, NJ 07446, USA

Angstrom Scientific Inc. is a distributor and manufacturer’s representative, focused on providing characterization solutions to the nanotech marketplace in the Americas. Companies represented:

BioNavis:
Provides surface analysis solutions in a number of key application areas.

DEBEN:
Deben manufactures innovative accessories for SEM’s and TEM’s, along with a large range of in-situ tensile testing stages for use with Optical Microscopes, X-Ray CT and XRD systems.

DENSsolutions:
DENSsolution is a leading supplier of top quality sample management solutions to enable atomic resolution, dynamic in-situ electron microscopy.

Encapsulix:
Encapsulix addresses the geometric scaling of critical Atomic Layer Deposition (ALD) requirements for industrial & microelectronic devices and films. Initial process focus is in thin Al2O3, TiO2 and ZnO specifically for encapsulation and barrier coatings.

Hitachi Nanotechnology Systems Division:
Hitachi Nanotechnology Systems Division (NSD) supportscustomers with a wide range of instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.

Jordan Valley:
Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology.

Kleindiek Nanotechnik
Kleindiek Nanotechnik offers a new level of precision in manipulation, probing, and characterization of nano-materials and semiconductors

Mel-build:
Mel-Build provides a wide verity of specialized holders for Transmission Electron Microscopes.

Microtrac:
Microtrac strives to provide the materials characterization world with innovative, reliable, and repeatable particle size, particle shape, particle charge, and surface area analysis instrumentation.

XEI Scientific:
XEI Scientific, Inc.provides an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.

www.angstrom.us
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Anton Paar TriTec, Peseux, Switzerland
Gare 4, Galileo Center, Peseux 2034, Switzerland

Anton Paar TriTec SA (previously CSM Instruments) has been leader in the development of instruments for surface mechanical properties characterization for over 30 years in both research and industrial fields.
CSM Instruments develops, manufactures and sells instruments to characterize mechanical properties of surfaces. We have been the world leader in this market for more than 30 years, first under the name of LSRH then CSEM.
CSM Instruments provides equipment that allows the mechanical characterization of a wide range of surfaces and bulk materials. Adhesion of paints, optical thin films or hard coatings can be defined using one of our Scratch Testers. These span the nano to the macro range to analyze the widest range of materials. Dynamic testing measurements can be performed to define not only the hardness of the material, but also to evaluate the plastic and elastic deformation, the elasticity module, creep and much more. For wear testing we offer the Tribometer, based on the pin-on-disc principle that operates both in the Micro and Nano regime; to record the frictional coefficient and measure the wear volume. Other equipment measures film thickness. Additionally, CSM provides three dimensional viewing capabilities of sample surfaces under most testing regimes.

Products
Indentation Testers
Scratch Test
Tribometer
Coating Thickness by Calotest
3D Imaging
Horology

http://www.csm-instruments.com
Anton Paar USA Inc., Ashland VA, USA
10215 Timber Ridge Dr., Ashland, VA 23005, USA
Anton Paar TriTec SA (previously CSM Instruments) has been leader in the development of instruments for surface mechanical properties characterization for over 30 years in both research and industrial fields.

Compression Presses

Anton Paar TriTec SA (previously CSM Instruments) has been leader in the development of instruments for surface mechanical properties characterization for over 30 years in both research and industrial fields.
CSM Instruments develops, manufactures and sells instruments to characterize mechanical properties of surfaces. We have been the world leader in this market for more than 30 years, first under the name of LSRH then CSEM.
CSM Instruments provides equipment that allows the mechanical characterization of a wide range of surfaces and bulk materials. Adhesion of paints, optical thin films or hard coatings can be defined using one of our Scratch Testers. These span the nano to the macro range to analyze the widest range of materials. Dynamic testing measurements can be performed to define not only the hardness of the material, but also to evaluate the plastic and elastic deformation, the elasticity module, creep and much more. For wear testing we offer the Tribometer, based on the pin-on-disc principle that operates both in the Micro and Nano regime; to record the frictional coefficient and measure the wear volume. Other equipment measures film thickness. Additionally, CSM provides three dimensional viewing capabilities of sample surfaces under most testing regimes.

Products
Indentation Testers
Scratch Test
Tribometer
Coating Thickness by Calotest
3D Imaging
Horology

http://www.csm-instruments.com/en/