For more than 30 years, Allied has offered customers superior quality products for metallographic sample preparation and analysis, experienced technical assistance, and warm, friendly service. Our measure of success has always been your complete satisfaction.
If you are not completely satisfied with any Allied consumable product, simply return it within 30 days, and we’ll either replace it or refund your money at your discretion.
Allied equipment carries a full 2-year warranty.
Equipment & Consumables:
Grinding & Polishing
Microscopes & Imaging
Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields. Angstrom Advanced scientific instruments and gas plants have been delivered to many renowned organizations. Angstrom Advanced goal is to provide our customers with the best products with highest standard of service at cost efficient pricing.
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of ellipsometry instruments including Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers. Angstrom Advanced also offers IR Spectroscopic Ellipsometer. Angstrom Advanced offers Lab test services. Angstrom Advanced Ellipsometry models are:
Angstrom Advanced PHE101 Discrete Wavelength Ellipsometer
Angstrom Advanced PHE102 Spectroscopic Ellipsometer
Angstrom Advanced PHE103 Spectroscopic Ellipsometer
Angstrom Advanced PHE104 IR Spectroscopic Ellipsometer
Angstrom Advanced Product lines include:
Angstrom Advanced Nuclear Magnetic Resonance (NMR)/Magnetic Resonance Imaging (MRI)
Angstrom Advanced X-ray Diffractometer, X-ray Flaw Detector
Angstrom Advanced Lab Gas Generator(Nitrogen, Hydrogen, Air)
Angstrom Advanced Atomic Force Microscope/Scanning Electron Microscope
Angstrom Advanced Hydrogen Generating Plant
Angstrom Advanced Nitrogen Generating Plant
Anton Paar TriTec SA (previously CSM Instruments) has been leader in the development of instruments for surface mechanical properties characterization for over 30 years in both research and industrial fields.
CSM Instruments develops, manufactures and sells instruments to characterize mechanical properties of surfaces. We have been the world leader in this market for more than 30 years, first under the name of LSRH then CSEM.
CSM Instruments provides equipment that allows the mechanical characterization of a wide range of surfaces and bulk materials. Adhesion of paints, optical thin films or hard coatings can be defined using one of our Scratch Testers. These span the nano to the macro range to analyze the widest range of materials. Dynamic testing measurements can be performed to define not only the hardness of the material, but also to evaluate the plastic and elastic deformation, the elasticity module, creep and much more. For wear testing we offer the Tribometer, based on the pin-on-disc principle that operates both in the Micro and Nano regime; to record the frictional coefficient and measure the wear volume. Other equipment measures film thickness. Additionally, CSM provides three dimensional viewing capabilities of sample surfaces under most testing regimes.
Coating Thickness by Calotest
A.P.E. Research develops and produces Scanning Probe Microscopes (SPM) for surface analysis and for biological applications, and high-resolution scientific instrumentation for nanotechnologies. The technological core business of A.P.E. Research is the Scanning Probe Microscopy (SPM).
A.P.E. Research has its own laboratory for instrumentation development and moreover the company is involved in several research projects of Italian, European and International research institutes and Universities in developing new scanning probe microscopes and innovative techniques for probe microscopy. The result of this research activity allows the company to supply always the state of the art products in a wide range of fields.
The A.P.E. Research catalog contains a standard version of Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM) and Near Field Optical Microscopes (SNOM). All these products can be provided with many additional tools and customized to meet the needs of the customer.
The company started at the AREA Science Park in 1997 and since 1999 is officially recognized as a spin-off from the INFM (Italian National Institute for Condensed Matter Physics).
Atomic Force Microscopy AFM
Scanning Near-field Optical Microscopy SNOM
Scanning Tunneling Microscope STM
Scanning Probe Microscopy SPM: Images, Probes & Accessories
Founded in 2003, Arradiance® combines unique talents in material science, charged particle physics, equipment design, modeling, simulation, vacuum technology, and metrology providing world class application of Atomic Layer Deposition(ALD) and Plasma Enhanced Deposition(PEALD) to the GEMStar XT product line.
With a concentration in Atomic Layer Deposition, charged particle physics and amplification, Arradiance is the first to develop and demonstrate the capability of producing high gain, low noise, and long life micro channel amplifiers. Using Atomic Layer Deposition (ALD) materials and equipment, Arradiance offers a new approach to electron amplification devices replacing the legacy traditional lead-glass/hydrogen firing process developed in 1960’s currently used for all state-of-the-art MCP applications.
Arradiance Atomic Layer Deposition (ALD) technology enables research in many areas:
MCP (Micro Channel Plate) Electron Amplification
Thermal and Fast Neutron Detection
Gaining an ever improved understanding of sample properties – this is what drives materials research in academia and industry. Whether you aim for fundamental understanding in materials science or want to improve the composition of future materials for energy storage or metals lightweight construction: ZEISS systems are designed to provide you all the data you need. Get to results fast with comprehensive workflow solutions for multi-modal, multi-scale microscopy and analysis from 2D to 3D to 4D.
Our advanced 3D X-ray microscopes (XRM) enable the discovery process that helps you advance innovation in your area of research or engineering. XRM can be used for many applications in a number of fields, including materials science, life sciences, natural resources and the electronics industry. The ability to visualize submicron features of your sample as small as 50 nm in size in native full volume 3D form, non-destructively, and to perform automated correlation of 2D images and complex data will enhance and possibly transform your critical imaging and data analysis tasks.
Cordin makes framing cameras, streak cameras and accessories. Framing cameras take a sequence of images. They are either Rotating Mirror or Gated Intensified in design. Streak cameras continuously record a line image. They are either Rotating Mirror or Image Converter in design.
Materials Science Applications include:
Shock Compression and Fracture
Nanoscale Material Behavior
Digital Surf has been developing surface imaging & metrology software for profilers and microscopes since 1989.
Mountains® 7 software technology is now offered by the majority of profiler and microscope manufacturers and is embedded in their equipment or available as an option.
Mountains® is the most complete surface analysis software on the surface measurement and inspection market today and is capable of analyzing data from a wide range of instrument families: 3D optical profilers, scanning profilometers, scanning probe microscopes (including AFMs), scanning electron microscopes, light microscopes, spectrometers etc.
Its unique easy-to-use interface enables users to:
- visualize their surface data in high quality 3D view
- characterize data in accordance with the latest metrology standards
- turn data into accurate, visual surface analysis reports.
Powerful automation tools allow users to save time and speed up productivity.
Mountains® software is currently available in 11 languages.
Business Website Address: www.digitalsurf.com
There is always more to see. And when you’re working with electron microscopy, the closer you can get to your sample, the more of its secrets it will reveal. That’s why at Gatan we have spent the last 50 years working with our customers to push the boundaries of what can be done with electron microscopy. Together, we have invented new approaches to problems that deliver fresh understanding. With state of the art cameras, imaging energy filters, specimen preparation equipment and other EM products and solutions, we take the most powerful microscopy on earth and make it work even harder for you.
Serial Block-Face Imaging
TEM & STEM Specimen Preparation
TEM Specimen Holders
TEM Imaging & Spectroscopy
TEM Analysis Software
SEM Specimen Preparation
SEM Specimen Stages
SEM Imaging & Spectroscopy
SEM Analysis Software