Angstrom Sun Technologies Inc. is a privately held company, headquartered in Boston, USA. The focus of company is to provide a series of cost-effective optical solutions for characterizing thin film thickness, thick coating thickness, their optical properties (refractive index N and extinction coefficient K), surface and interface behavior, alloy concentrations and their uniformities across surface.
Affordable, low cost, but advanced and high performance tools, including spectroscopic reflectometer, microspectrophotometer, microreflectometer, film thickness mapping system, simple desktop film thickness station, and automatic variable angle spectroscopic ellipsometers, offer a way to probe film stacks nondestructively and precisely. In addition, Angstrom Sun Technologies Inc. also delivers advanced analytical services for characterizing thin films, thick coatings and complicated layer stacks.
Angstrom Sun Technologies Inc. designs and manufactures all TFProbe tools in a facility located in Boston, USA. TFProbe tools are sold and distributed by international sales networks.
With performance and professional support as our mission, Angstrom has established a worldwide customer base since 2002, including well-known education institutions, government agencies and Fortune 500 companies, such as NASA Marshall Space Flight Center, National Institute of Standards and Technology, Massachusetts Institute of Technology (MIT), Seoul National University, NanoTech Center (CESTM) at SUNY, Columbia University, Hewlett-Packard Co., Lockheed Martin Co., General Electric (GE), Corning Inc., Bell Laboratories, Johnson-Johnson, Mylan Technologies, Applied Materials (AMAT), Lam Research, Samsung Advanced Institute of Technology(SAIT), and MIT Lincoln Laboratory.
Thin Film Mapping Systems
Integrated In-line Metrology
Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, film-thickness measurement instruments cost $50,000 or more and required advanced training. Single measurements took as long as an hour.
The Filmetrics approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second – by operators who can be trained in minutes.
In just one click, we measure thin-film thickness by analyzing how the film reflects light. By measuring light not visible to the human eye, films as thin as 1nm and as thick as 13mm can be measured. And, because there are no moving parts, results are available in seconds: film thickness, color, refractive index, and even roughness.
Spectral Reflectance SR
SR vs Ellipsometry
SR vs Profilometry
Refractive Index Database
The HORIBA Group of worldwide companies provides an extensive array of instruments and systems for applications ranging from automotive R&D, process and environmental monitoring, in-vitro medical diagnostics, semiconductor manufacturing and metrology, to a broad range of scientific R&D and QC measurements. Proven quality and trustworthy performance have established widespread confidence in the HORIBA Brand.
HORIBA International Corporation (HIC) commands successful leadership spanning North and South America with operations positioned coast-to-coast, including Canada and Brazil. HIC, financial holding company for all Americas-region entities, continues to experience active growth while implementing the sharing of corporate resources. Exemplifying a unified contribution to global environmental conservation, HORIBA continues its spirited commitment to society.
Science Applications include:
Atomic Emission Spectroscopy
Detectors-CCD, PDA, InGaAs
Plasma Profiling TOFMS
The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting as a spin-off from the University of Nebraska, the J.A. Woollam Company has rapidly grown to become a worldwide leader in spectroscopic ellipsometry. We have been perfecting our technology for over 25 years and have secured over 100 patents.
The company employs more than 45 people, the majority of whom are engineers and scientists dedicated to the advancement of ellipsometry. We pride ourselves on the quality and workmanship of our products. Each system we sell is hand-assembled using custom- machined aluminum and high quality optics and electronics.
JASCO provides an extensive range of spectroscopy and chromatography analytical instruments and accessories, service and support, news releases, corporate information, and employment opportunities.
Formed in 1958, JASCO is a first-rate Japanese based company, operating throughout the Americas, Asia, Europe, Oceania, and the Middle East. During these past 50 years of proven track record, JASCO has built a reputation for continually providing high-quality products and successfully finding solutions for our valuable portfolio of long term clients. Our principal goal still remains that we ensure our customers are completely satisfied from Order Placement through installation, training, and beyond.
Materials Science Applications include:
NANOLANE is specialized in optical solutions at nanoscale and commercializes characterization tools based on the label-free patented SEEC (Surface Enhanced Ellipsometry Contrast) optical technique which extends the analysis possibilities of optical systems in the field of nanotechnologies.
Our products are suitable for characterization in the following topics: Life Sciences, Materials, nano-objects…To guarantee the quality and the performances of our products, NANOLANE benefits from specific work areas such as optical laboratories and ISO3 class clean room to test and develop for you new optical solutions. Thanks to our multidisciplinary team, we also provide expertise in topics such as optical systems, thin films and coatings and image processing.
Nanolane benefits from a complete expertise in optics which allows it to optimize the optical microscopy to make it a technique of successful analysis in the field of the nanotechnologies.
This expertise is now offered to answer your issues in optical visualization and characterization. Nanolane proposes the study, the design and the manufacture of optical dedicated systems (i.e. optics for AFM, RAMAN…).
SEEC slides consist of a stack of optical layers piled up on a thick base of silicon or glass. The astounding optical properties of SEEC slides result from a rigorous control of the conditions and parameters under which specific optical layers are being deposited onto supporting plates. Thanks to this know-how, Nanolane offers you solutions in surface treatment, nano-patterning, coating… fitting your needs.
Nanolane has developed a proprietary software including the camera control, the images/videos recording and also a powerful image processing analysis tool (image processing in real-time) very appreciated by users to get high-resolution images.
This competence in software design and image processing analysis is now offered to users looking for samples with a high definition. Nanolane can design and manufacture for you dedicated tools for your applications.
Materials Applications include:
SCI is a world leader in providing high resolution thin-film metrology systems and analysis software products to leading companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries. SCI is a privately held company headquartered in Carlsbad, California, with a global network of sales, service, and support offices strategically located in the United Kingdom, Germany, Taiwan, Singapore, Korea, and Japan.
Multiple Angle Reflectometers
Generalized Ellipsometry for Optical CD Measurement
FilmTek metrology systems can measure a broad array of single and multi-layer films including metallic, semiconductor, amorphous, crystalline, and dielectric materials on virtually any substrate. FilmTek can simultaneously determine:
Multiple layer thicknesses (from <1Å to 250 microns)
Indices of refraction (both TE and TM components of index)
Extinction (absorption) coefficients
Energy band gap
Surface roughness and damage
Porosity, composition, and crystallinity (EMA model)
Film properties versus temperature
Wafer curvature and film stress
SENTECH Instruments develops, manufactures, and sells worldwide advanced quality instrumentation for Plasma Etching, PECVD, Atomic Layer Deposition, Thin Film Measurement (Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Laser Ellipsometer) and Photovoltaics.
Atomic Layer Deposition
Silicon Solar Cells
Thin Film Solar Cells