Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields. Angstrom Advanced scientific instruments and gas plants have been delivered to many renowned organizations. Angstrom Advanced goal is to provide our customers with the best products with highest standard of service at cost efficient pricing.
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of ellipsometry instruments including Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers. Angstrom Advanced also offers IR Spectroscopic Ellipsometer. Angstrom Advanced offers Lab test services. Angstrom Advanced Ellipsometry models are:
Angstrom Advanced PHE101 Discrete Wavelength Ellipsometer
Angstrom Advanced PHE102 Spectroscopic Ellipsometer
Angstrom Advanced PHE103 Spectroscopic Ellipsometer
Angstrom Advanced PHE104 IR Spectroscopic Ellipsometer
Angstrom Advanced Product lines include:
Angstrom Advanced Nuclear Magnetic Resonance (NMR)/Magnetic Resonance Imaging (MRI)
Angstrom Advanced X-ray Diffractometer, X-ray Flaw Detector
Angstrom Advanced Lab Gas Generator(Nitrogen, Hydrogen, Air)
Angstrom Advanced Atomic Force Microscope/Scanning Electron Microscope
Angstrom Advanced Hydrogen Generating Plant
Angstrom Advanced Nitrogen Generating Plant
Angstrom Scientific Inc. is a distributor and manufacturer’s representative, focused on providing characterization solutions to the nanotech marketplace in the Americas. Companies represented:
Provides surface analysis solutions in a number of key application areas.
Deben manufactures innovative accessories for SEM’s and TEM’s, along with a large range of in-situ tensile testing stages for use with Optical Microscopes, X-Ray CT and XRD systems.
DENSsolution is a leading supplier of top quality sample management solutions to enable atomic resolution, dynamic in-situ electron microscopy.
Encapsulix addresses the geometric scaling of critical Atomic Layer Deposition (ALD) requirements for industrial & microelectronic devices and films. Initial process focus is in thin Al2O3, TiO2 and ZnO specifically for encapsulation and barrier coatings.
Hitachi Nanotechnology Systems Division:
Hitachi Nanotechnology Systems Division (NSD) supportscustomers with a wide range of instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.
Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology.
Kleindiek Nanotechnik offers a new level of precision in manipulation, probing, and characterization of nano-materials and semiconductors
Mel-Build provides a wide verity of specialized holders for Transmission Electron Microscopes.
Microtrac strives to provide the materials characterization world with innovative, reliable, and repeatable particle size, particle shape, particle charge, and surface area analysis instrumentation.
XEI Scientific, Inc.provides an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.
Bruker Nano Analytics presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes.
With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.
Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.
Besides this unparalleled range of analytical tools for electron microscopes (EM), Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.
As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers to you innovative high-performance technology. With our worldwide network of service centers and application specialists we are always close to your analytical needs.
EM Analyzers: Advancing Materials Characterization in EM
Micro-XRF and TXRF: Elemental Analysis in Research and Industry
From its inception in 1929, CAMECA has been renowned for its precision mechanics, optics and electronics. The company started in France as a manufacturer of movie theater projectors, and soon the CAMECA products evolved into scientific instrumentation. Since pioneering Electron Probe MicroAnalysis (EPMA) in the 1950’s and Secondary Ion Mass Spectrometry (SIMS) in the 1960’s, CAMECA has remained the undisputed world leader in these techniques while achieving numerous breakthrough innovations in complementary techniques such as Low energy Electron induced X-ray Emission Spectrometry (LEXES), and 3D Atom Probe. CAMECA has evolved from a manufacturer of scientific instrumentation for the international research community to a provider of in-fab and near-fab metrology solutions for the semiconductor manufacturing industry.
Today, CAMECA employs over 300 employees around the world, with locations in the USA, Germany, Japan, Korea, China, and Taiwan, and a wide network of agents, ensuring the best level of support to all users. Our mission is to focus on instrumental development to offer our customers the highest analytical performance in their specialized characterization fields.
CAMECA is headquartered in Gennevilliers near Paris, France. Our plant is a state-of-the-art facility with clean room environment, electron and ion optics simulation, advanced CAD, UHV cleaning… Operating under ISO 9001 certification, CAMECA controls not only the technology, but all aspects in the designing, manufacturing, installing and servicing of its products.
In 2007, CAMECA joined AMETEK, Inc., a leading global provider of electronic instruments and electromechanical devices, as part of the AMETEK Materials Analysis Division.
Secondary Ion Mass Spectrometry SIMS & Nano-SIMS
Electron Probe MicroAnalysis EPMA
3D Atom Probe Microscope
Delmic B.V. is a company based in Delft, the Netherlands that produces correlative light and electron microscopy solutions. Currently, DELMIC produces three systems, the SECOM, a platform for integrated fluourescence and electron microscopy, the SPARC, a high-performance cathodolumiscence detection system, and the Delphi, the world’s first fully integrated fluourescence and scanning electron microscope and the product of a collaboration with Phenom-World. These systems are also accompanied by ODEMIS, open-source software designed to navigate the integrated microscopy systems and to optimize image overlay.
Delmic originated as a result of the development of the SECOM platform, an integrated fluorescence and scanning electron microscope which was conceived by Charged Particle Optics group of Delft University of Technology. At the end of 2011 the company obtained the SPARC system from the Photonic Materials Group group at AMOLF. At the International Microscopy Conference in 2014, DELMIC also launched the Delphi system, a tabletop correlative microscopy solution that, like SECOM, combines a scanning electron microscope with fluorescence microscopy.
The Delong Group of Companies operates in the high tech, engineering design, manufacturing and sales sectors and spans two continents with operations in Europe and North America.
Our facilities in Brno, Czech Republic are specialized in the design and manufacturing of precision components, electron optics and vacuum technologies. Our new building is equipped with the latest in design and precision manufacturing innovations.
Low voltage transmission electron microscopes LVEM5, LVEM 25.
Low voltage scanning electron microscopes from 0 V up to 25 kV.
Compact powerful Schottky electron guns from 2 kV up to 12 kV.
Unique solutions of electron-optical devices.
For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME’s key points are easy usability, manufacturing by ourselves, and flexibility.
Our instruments are characterized by the simplest possible operation combined with the capability of a high throughput. When it comes to new developments, we take great care to secure that the instruments will not “feel” like a prototype afterwards. Naturally, also new developments are supported by corresponding software. Take cantilever change as an example: For our DS 95 AFM, exchanging the cantilever takes only some seconds. Adjustment and approach are fully automatic, and optionally we also offer a full automatic cantilever changer. Furthermore, all our AFM scanners have a built-in optics facilitating the location of a specific place on the sample surface. Both guarantee efficient work and a high throughput.
Our instruments are characterized by an optimal combination of mechanics, electronics, and software. Only by in-depth harmonization of all three components, a good scanning probe microscope can be obtained. Our developers work interdisciplinarily: To make a good control software the developer must for example have also a deep understanding of mechanics and electronics. In the same manner, the mechanical development process must consider how the electronics and software will later control the system. Actually, the real power of our team of developers lies in the interdisciplinary work and the permanent overview of the whole concept.
All main parts of our Scanning Probe Microscopes are of our own manufacture; this includes the piezo motors for approach, the electronics, our software, and naturally our mechanical design. This has the advantage that we are able to quickly make modifications in all parts of the instruments, should a certain application require such.
Optical Nearfield Microscopy
El-Mul Technologies is an innovative and experienced solution provider and OEM manufacturer of in-vacuum charged particle detection systems and devices.
With over 20 years of experience, El-Mul is recognized for its ground-breaking products, world-class quality standards and dedicated service.
El-Mul’s products are specially designed for advanced analytical SEM/TEM systems, focused ion beam (FIB) tools, inspection and metrology semiconductor e-beam tools, mass spectrometry and other vacuum systems