Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields. Angstrom Advanced scientific instruments and gas plants have been delivered to many renowned organizations. Angstrom Advanced goal is to provide our customers with the best products with highest standard of service at cost efficient pricing.
Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of ellipsometry instruments including Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers. Angstrom Advanced also offers IR Spectroscopic Ellipsometer. Angstrom Advanced offers Lab test services. Angstrom Advanced Ellipsometry models are:
Angstrom Advanced PHE101 Discrete Wavelength Ellipsometer
Angstrom Advanced PHE102 Spectroscopic Ellipsometer
Angstrom Advanced PHE103 Spectroscopic Ellipsometer
Angstrom Advanced PHE104 IR Spectroscopic Ellipsometer
Angstrom Advanced Product lines include:
Angstrom Advanced Nuclear Magnetic Resonance (NMR)/Magnetic Resonance Imaging (MRI)
Angstrom Advanced X-ray Diffractometer, X-ray Flaw Detector
Angstrom Advanced Lab Gas Generator(Nitrogen, Hydrogen, Air)
Angstrom Advanced Atomic Force Microscope/Scanning Electron Microscope
Angstrom Advanced Hydrogen Generating Plant
Angstrom Advanced Nitrogen Generating Plant
Delmic B.V. is a company based in Delft, the Netherlands that produces correlative light and electron microscopy solutions. Currently, DELMIC produces three systems, the SECOM, a platform for integrated fluourescence and electron microscopy, the SPARC, a high-performance cathodolumiscence detection system, and the Delphi, the world’s first fully integrated fluourescence and scanning electron microscope and the product of a collaboration with Phenom-World. These systems are also accompanied by ODEMIS, open-source software designed to navigate the integrated microscopy systems and to optimize image overlay.
Delmic originated as a result of the development of the SECOM platform, an integrated fluorescence and scanning electron microscope which was conceived by Charged Particle Optics group of Delft University of Technology. At the end of 2011 the company obtained the SPARC system from the Photonic Materials Group group at AMOLF. At the International Microscopy Conference in 2014, DELMIC also launched the Delphi system, a tabletop correlative microscopy solution that, like SECOM, combines a scanning electron microscope with fluorescence microscopy.
There is always more to see. And when you’re working with electron microscopy, the closer you can get to your sample, the more of its secrets it will reveal. That’s why at Gatan we have spent the last 50 years working with our customers to push the boundaries of what can be done with electron microscopy. Together, we have invented new approaches to problems that deliver fresh understanding. With state of the art cameras, imaging energy filters, specimen preparation equipment and other EM products and solutions, we take the most powerful microscopy on earth and make it work even harder for you.
Serial Block-Face Imaging
TEM & STEM Specimen Preparation
TEM Specimen Holders
TEM Imaging & Spectroscopy
TEM Analysis Software
SEM Specimen Preparation
SEM Specimen Stages
SEM Imaging & Spectroscopy
SEM Analysis Software
SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 61 countries.
SPIP™ supports 104 file formats for various instrument types, including:
SPM, AFM, STM
Soquelec limited is a Montreal-based company that focuses on sales and service of scientific equipment for applications in materials and life sciences. It is the Canadian distributor of manufacturers of digital imaging technology and accessories, such as Electron Microscopy, Atomic Force Microscopy, X-Ray scanning and sample preparation. It is also a provider of laboratory consumables. Soquelec was founded in 1974 by Jean-Pierre and Yvette Slakmon. It has continuously operated in the Canadian market and has been involved in the installation of over 200 electron optical systems in universities, hospitals and private companies.
Sample Preparation Equipment
TEM Analysis Services – Providing high quality, affordable TEM Analysis and imaging services of semiconductors, materials and nanoparticles for over 30 years
For nearly 50 years, TREK , INC. has been providing innovative electrostatic measurement and high-voltage power solutions to customers worldwide. Trek’s superior engineering design capability and manufacturing facilities allow us to provide high quality, cost-effective products and services to meet market needs and customer-specific applications.
Our proprietary technology and technical expertise, coupled with our long-term relationships, sets us apart from our competitors and has made us the leader in the markets we serve.
Trek’s commitment to develop new technologies will enable us to continue to provide current and future customers with innovative solutions.
A significant portion of Trek’s business is derived from the design and manufacture of custom products for OEM customers. Trek has been supplying solutions to some of these customers for over 20 years. Although we cannot disclose information about our custom OEM designs, the following provides some perspective on our capabilities. If this information interests you, please contact us to initiate a dialogue regarding your specific requirements for custom-designed product solutions.
Research & Development
Metrology: These products are used for precision measurements of voltage and surface charge distributions; resistance and resistivity meters are also utilized.
Angstrom Scientific Inc. is a distributor and manufacturer’s representative, focused on providing characterization solutions to the nanotech marketplace in the Americas. Companies represented:
Provides surface analysis solutions in a number of key application areas.
Deben manufactures innovative accessories for SEM’s and TEM’s, along with a large range of in-situ tensile testing stages for use with Optical Microscopes, X-Ray CT and XRD systems.
DENSsolution is a leading supplier of top quality sample management solutions to enable atomic resolution, dynamic in-situ electron microscopy.
Encapsulix addresses the geometric scaling of critical Atomic Layer Deposition (ALD) requirements for industrial & microelectronic devices and films. Initial process focus is in thin Al2O3, TiO2 and ZnO specifically for encapsulation and barrier coatings.
Hitachi Nanotechnology Systems Division:
Hitachi Nanotechnology Systems Division (NSD) supportscustomers with a wide range of instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.
Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology.
Kleindiek Nanotechnik offers a new level of precision in manipulation, probing, and characterization of nano-materials and semiconductors
Mel-Build provides a wide verity of specialized holders for Transmission Electron Microscopes.
Microtrac strives to provide the materials characterization world with innovative, reliable, and repeatable particle size, particle shape, particle charge, and surface area analysis instrumentation.
XEI Scientific, Inc.provides an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.
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Bruker Nano Analytics presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes.
With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.
Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.
Besides this unparalleled range of analytical tools for electron microscopes (EM), Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.
As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers to you innovative high-performance technology. With our worldwide network of service centers and application specialists we are always close to your analytical needs.
EM Analyzers: Advancing Materials Characterization in EM
Micro-XRF and TXRF: Elemental Analysis in Research and Industry
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From its inception in 1929, CAMECA has been renowned for its precision mechanics, optics and electronics. The company started in France as a manufacturer of movie theater projectors, and soon the CAMECA products evolved into scientific instrumentation. Since pioneering Electron Probe MicroAnalysis (EPMA) in the 1950’s and Secondary Ion Mass Spectrometry (SIMS) in the 1960’s, CAMECA has remained the undisputed world leader in these techniques while achieving numerous breakthrough innovations in complementary techniques such as Low energy Electron induced X-ray Emission Spectrometry (LEXES), and 3D Atom Probe. CAMECA has evolved from a manufacturer of scientific instrumentation for the international research community to a provider of in-fab and near-fab metrology solutions for the semiconductor manufacturing industry.
Today, CAMECA employs over 300 employees around the world, with locations in the USA, Germany, Japan, Korea, China, and Taiwan, and a wide network of agents, ensuring the best level of support to all users. Our mission is to focus on instrumental development to offer our customers the highest analytical performance in their specialized characterization fields.
CAMECA is headquartered in Gennevilliers near Paris, France. Our plant is a state-of-the-art facility with clean room environment, electron and ion optics simulation, advanced CAD, UHV cleaning… Operating under ISO 9001 certification, CAMECA controls not only the technology, but all aspects in the designing, manufacturing, installing and servicing of its products.
In 2007, CAMECA joined AMETEK, Inc., a leading global provider of electronic instruments and electromechanical devices, as part of the AMETEK Materials Analysis Division.
Secondary Ion Mass Spectrometry SIMS & Nano-SIMS
Electron Probe MicroAnalysis EPMA
3D Atom Probe Microscope