Dimensional Metrology

Anton Paar USA Inc., Ashland VA, USA
10215 Timber Ridge Dr., Ashland, VA 23005, USA
Anton Paar TriTec SA (previously CSM Instruments) has been leader in the development of instruments for surface mechanical properties characterization for over 30 years in both research and industrial fields.

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Anton Paar TriTec SA (previously CSM Instruments) has been leader in the development of instruments for surface mechanical properties characterization for over 30 years in both research and industrial fields.
CSM Instruments develops, manufactures and sells instruments to characterize mechanical properties of surfaces. We have been the world leader in this market for more than 30 years, first under the name of LSRH then CSEM.
CSM Instruments provides equipment that allows the mechanical characterization of a wide range of surfaces and bulk materials. Adhesion of paints, optical thin films or hard coatings can be defined using one of our Scratch Testers. These span the nano to the macro range to analyze the widest range of materials. Dynamic testing measurements can be performed to define not only the hardness of the material, but also to evaluate the plastic and elastic deformation, the elasticity module, creep and much more. For wear testing we offer the Tribometer, based on the pin-on-disc principle that operates both in the Micro and Nano regime; to record the frictional coefficient and measure the wear volume. Other equipment measures film thickness. Additionally, CSM provides three dimensional viewing capabilities of sample surfaces under most testing regimes.

Products
Indentation Testers
Scratch Test
Tribometer
Coating Thickness by Calotest
3D Imaging
Horology

http://www.csm-instruments.com/en/
Eastern Applied Research, Lockport NY, USA
6614 Lincoln Ave., Lockport, NY 14094, USA

In 1991, Eastern Applied Research began as a regional service provider for x-ray fluorescence instruments. Technical associates offered on-site certification, consultation, and repair services with a focus on the East Coast of the United States. Those associates realized that most clients were looking for a single source for XRF Technology service and support. So, Eastern Applied added an in-house standards laboratory for standard re-certification and manufacturing of new XRF standards. They also began offering XRF analyzers for their clients testing needs.

In time, through the organizations dedication to offering efficient response times and competitive pricing (an overall dedication to customer satisfaction) the client list grew and demanded additional technical staff be added to support that demand. Expanding the on-site service personal to include representatives to cover Central and Western United States was the next step in the evolution of this complete service provider. Eastern Applied Research has continued to grow over the years and now provides service and support throughout North America – covering Canada and Mexico with bi-lingual service personal as needed.

Eastern Applied’s core technical staff has a complete working knowledge of a wide range of XRF analyzer models and the field staff receives extensive training on each model to insure a satisfactory experience for the client. Sales of XRF analyzers has expanded from just reconditioned systems (used XRF) to include new analyzers from a leader in XRF technology – Hitachi High-Tech. XRF analyzers from Hitachi High-Tech are known for providing the highest reliability and excellent precision for a large number of application interests.

Applications include:
Thickness Measurements
RoHS Testing
Analytical Laboratory
Process Control
Alloy Analysis
Geological Testing

http://www.easternapplied.com/
HMK Test, Liaoning, China
No.32 Xingsan Road, Dandong 118000, Liaoning, China

HMK Test is a lab instruments manufacturer and supplier. We are founded in 1997 and supported by senior researchers and professionals who were ex-workers in national lab. 99% of our products are ordered by world buyers which put forward higher quality requirement on HMK Test. Moreover HMK Test cooperated with scientific institutes and organized seminars to hear from the end users. Such move enormously improve both quality and performance of our products. In fact our products are made by our professionals and the end user together. The total staff has reached 20,000 and our products are sold to more than 150 countries in the world and are welcome by our end users and distributors in many industrial applications.

Technology:
Laser Diffraction
Static Light Scattering
Dynamic Light Scattering
Image Analysis
Air Permeability
Gas Adsorption
Funnel Method
Sieve Analysis

www.hmk-test.com
k-Space Associates, Dexter MI, USA
2182 Bishop Circle East, Dexter, MI 48130, USA

k-Space Associates, Inc. is a leading manufacturer of in situ, in-line, and ex situ metrology tools for the semiconductor, thin-film, and photovoltaic (PV) industries. Our tools are used for monitoring nearly all thin-film deposition processes, including MBE, MOCVD, PLD, PVD, sputtering, and evaporation. Incorporated in 1992 and driven to supply the best technical support in the industry, our tools are used worldwide in both research and full production monitoring of semiconductor, PV, thin-film deposition, annealing, and processing applications.

kSA products measure important parameters such as temperature, deposition rate, film thickness, stress, curvature, bow, reflectivity, surface roughness, and many other material properties. These are measured in real-time by utilizing probes such as lasers, white light, UV light sources, and electron beams to investigate thin-films and substrates at an atomic level. Our thin-film analysis tools are used to extract real-time information from today’s most advanced deposition and processing applications within compound semiconductor, silicon semiconductor and photovoltaic advanced thin film production and R&D.
Sophisticated software analysis and reporting capabilities provide information to better understand tomorrow’s electronic and optoelectronic devices or to provide online control during mass production to enhance yield. Tailored optics and fully integrated solutions have been designed for simple mounting and non-invasive monitoring of advanced deposition processes such as:
MBE
Sputtering
PLD
E-beam Evaporation
MOCVD
Ex Situ Characterization

http://www.k-space.com/
Kett, Villa Park CA, USA
PMB 504, 17853 Santiago Blvd. Ste. 107
Villa Park, CA 92861
Instant measurement instruments for process control, QC and laboratory use.

Kett was started by four engineers in 1946. After initially introducing a wood moisture tester and metal detector, it was their vision to design and manufacture portable handheld moisture analyzers. The goal was to provide a rice farmer with the same level of measurement quality available within government test labs. As is still true today, the customer depended on the accuracy of this measurement and the reliability of his instrument to standardize the quality of his harvested rice product. This standardization would provide him with an optimal harvest yield, maximizing his return on investment.
After the successful introduction of the Riceter, which is still the standard for portable rice moisture testing, the Kett development staff expanded into Coating Thickness Gauges for the emerging Japanese automobile industry. In addition, they quickly released additional moisture testers for other agricultural applications and infrared Moisture Balances for general purpose moisture analyses.
Awards for instrument design and performance followed shortly after and continue to this day.
Today our focus is moisture and organic composition analysis, coating thickness measurement, friction, wear, peel, adhesion and other surface property analyses, rice quality instrumentation and other agricultural test instruments for the grain and seed marketplace.

www.kett.com
1-714-974-8837
Taber Industries, Materials Test & Measurement Div., North Tonawanda NY, USA
455 Bryant Street, North Tonawanda, NY 14120, USA

Taber Industries’ Materials Test and Measurement Division is a global leader for the design and manufacture of high quality, affordable test instruments. Used to evaluate the physical properties of materials, Taber instruments play a critical role in the way companies test the durability of their products. Best known for our expertise in abrasion and surface wear, Taber also offers solutions to measure resistance to scratch, mar and scuff damage; along with bending resiliency and stiffness.

Products:
Wear/Abrasion
Scratch/MAR
Bending/Stiffness
Optical Micrometer

www.taberindustries.com
TEM Analysis, Azle TX, USA
517 Inland Circle, Azle, TX 76020, USA
TEM Analysis Services – Providing high quality, affordable TEM Analysis and imaging services of semiconductors, materials and nanoparticles for over 30 years

TEM Analysis Services – Providing high quality, affordable TEM Analysis and imaging services of semiconductors, materials and nanoparticles for over 30 years

http://tem-analysis.com/
817-400-6547
University Wafer, Boston MA, USA
66 N Street, Unit #9, South Boston, MA 02127, USA

University Wafer is a Leading Supplier of Silicon Wafers and other Substrates.

One of the most tedious processes in supplying the researchers with affordable substrates is quoting. In fact, it is so time consuming that most wafer supply firms won’t even quote a job for a small run, never-mind a single wafer.

Most researchers have experienced being ignored. They send a request, then they wait for the quote that never comes. They then send a follow-up email. And they wait some more. Finally the researcher makes the phone call. When the researcher tells the wafer vendor that they just want one wafer they are either hung-up on or provided with a ridiculously high quote and long lead-items.

But there is hope!

UniversityWafer, Inc. was created to cater to the researcher who wants small quantities and short lead-times. Our professional staff is trained to handle even the most difficult low volume requests and we pride ourselves on fast responses and turnaround.

Why buy in volume if you don’t have to?!

Chris Baker
President

http://www.universitywafer.com/
ZYGO Corp. (Div. Of AMETEK), Middlefield CT, USA
Laurel Brook Road, Middlefield, CT 06455-1291, USA

Zygo Corporation is a global leader in the design and manufacture of advanced optical metrology systems and ultra-precise optical components and assemblies.
Our Metrology business segment is comprised of three major groups: optical surface profilers, laser interferometers, and stage position metrology. The products and systems produced by these groups employ various optical phase analysis techniques for measuring displacement, surface shape and texture, and film thickness. Applications for our metrology products are diverse, and include precision machining, optical manufacturing, and semiconductor manufacturing, as well as many others.
Our Optics business segment is comprised of two major groups: Electro-Optics and Optical Components. These groups leverage ZYGO’s expertise in optical design and assembly, and high-volume manufacturing of precision optical components and systems, for aerospace, defense, medical, and industrial applications.
Recognized as a valued partner by its customers for innovative technology, application expertise, product reliability, and responsiveness, ZYGO leverages its differentiated core competencies in metrology and optics to assist these customers in becoming leaders in their respective markets.
Founded in 1970, and headquartered in Middlefield, Connecticut, USA, ZYGO’s global operations are supported by approximately 500 dedicated and highly-skilled individuals around the world. Throughout its history, ZYGO has been driven by a passion for innovation, as evidenced by approximately 1,200 patents awarded since the Company’s founding.
In 2014, ZYGO became part of the Ultra Precision Technologies Division of AMETEK, Inc., a leading global manufacturer of electronic instruments and electro-mechanical devices. With annual sales over $4 billion, AMETEK has more than 15,000 colleagues at nearly 150 operating locations, and a network of sales, service and support locations across the United States and in 30 other countries. ZYGO enjoys mutually-beneficial relationships with its AMETEK sister companies, collaborating on technologies and sharing resources in order to provide the best possible experience for our customers.
While we are a part of the AMETEK family, we are still the same Zygo Corporation that you have known and trusted for over 45 years, committed to serving your precision metrology and optics needs now and in the future.

Metrology Products:
Optical Surface Profilers
Laser Interferometers
Semiconductor Systems
Stage Position Metrology
Testing & Certification Services

Optics:
Optical Components Group

Electro-Optics Group:
Engineering & Product Development
Electro-Optical Assembly
Opto-Mechanical Assembly
Turnkey System Manufacturing

www.zygo.com
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AEP Technology. Santa Clara CA, USA
1900 Wyatt Dr., Suite 17, Santa Clara, CA 95054, USA
AEP is the world leader in surface metrology and technology innovation. From its inception it has developed cutting edge instruments to aid researchers and users. As the pioneers of innovation in hi tech engineering, it has grown steadily in worldwide markets. Currently it has offices in America, Asia and Europe.

AEP is the world leader in surface metrology and technology innovation. From its inception it has developed cutting edge instruments to aid researchers and users. As the pioneers of innovation in hi tech engineering, it has grown steadily in worldwide markets. Currently it has offices in America, Asia and Europe.
In addition to manufacturing optical profiler, interferometer and contact profilometer AEP also produces ex-situ and in-situ stress monitors for thin film deposition processes. Please contact us for any questions. Our team of scientists from silicon valley are always excited to answer your questions and help solve your problems.
Applications:
Step heights measurement
Surface Roughness measurement
Quantify scratch and dig features, wear depth, width and volume
Flatness or curvature measurement
2D thin film stress measurement
Film thickness
Surface Profiling – defect, features etc. depth, width and volume
Hardness
Wear Lubricity
Scratch
Roughness
Friction
Adhesion
Defectivity
Fatigue
Durability
Creep Cracks
Tensile
Stress
Indent
Delamination
Elasticity
Modulus

http://www.aeptechnology.com/