Atomic Force Microscopy
Since its establishment, “Advanced Technologies Center” focuses on engineering, development and production of precision instrumentation for research at the micro- and nano-meter scale. The company is one of the pioneers on the atomic force microscopy market in Russia.
Over the past 20 years since company foundation, consumers were offered a number of high-precision measuring equipment conforming the highest international standards. The most well-known ATC product in Russia and abroad, is scanning probe microscope under FemtoScan trademark and FemtoScan Online software, which is highly demanded due to the excellent performance and reasonable price.
Atomic Force Microscopy AFM
Scanning Probe Microscopy SPM
Scanning Resistance Microscopy SRM
Scanning Tunneling Microscopy STM
Electrostatic Force Microscopy
AFM Workshop’s mission is to develop and market innovative Atomic Force Microscope products and components for research, development, OEMs and education. We support our customers with workshops on the construction, operation and applications of our products. We are committed to an open architecture that facilitates innovation by our customers.
Dr. Paul West is the founder of AFMWorkshop. Dr. West began his career working with scanning tunneling microscopes (STM) as a postdoc at the California Institute of Technology in 1983 where he built one of the world’s first STMs. His career in the development and application of scanning probe microscopes spans over 30 years.
Paul pioneered the investigation of nanotechnology applications for scanning probe microscope (SPM) technology, resulting in patents for nanoscale motion sensors (US Patent #5,009,111, nanoscale position sensors (US patent #5,257,024) and nanoscale digital mass storage (US patent # 4,956,817).
Innovative SPM products invented by Dr. West include:
Fully integrated AFM system having motorized sample positioners, a video microscope and vibration isolation (U.S. Patent #5,291,775).
Tip scanning light lever AFM (U.S. Patent # 5,319,960)
Resistive scanning thermal sensing probes (U.S. Patent #5,441,343)
Integrated AFM with SEM (U.S. Patent #5,455,420)
Dr. West holds patents for many additional AFM/SPM products and applications.
In thirty years of AFM instrument innovation, Dr. West has founded several Atomic Force Microscope manufacturing companies. Over the years, those companies and their patents were acquired by companies such as Agilent Technologies, and ThermoElectron/Veeco/Bruker. Thousands of atomic force microscopes developed by Dr. West are in use throughout the world and have resulted in many scientific publications, Ph.D. dissertations, and technical breakthroughs.
With over 15 years experience in combined AFM/SPM/Raman Spectroscopy, our main focus is on the innovative research and development of advanced integrated scanning systems for nanotechnology.
Besides the most progressive engineering in the field including custom devices for OEM customers, outsourcing and R&D in nanotechnology, AIST-NT offers the highest quality service and customer support.
The SmartSPM 1000 Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes. With the SmartSPM zooming down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with NSOM, Raman and TERS/SERS techniques.
The CombiScope 1000 Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed only available from AIST-NT. Plus it can be easily upgraded to our OmegaScope AFM-Raman system
The OmegaScope 1000 is a state-of-the-art turn-key solution that combines confocal NanoRaman/ Fluorescence spectroscopy and ultra resolution multi-range research AFM enabling TERS (Tip Enhanced Raman Scattering) mapping. It is available in both transmission and reflection configurations providing direct top, bottom and side optical access. The flexibility of the OmegaScope platform offer almost endless possibilities in correlation of high spatial resolution Raman and AFM data.
SPM Accessories: A wide range of AFM probes, cantilevers, calibration gratings and test samples.
Anasys Instruments and our scientific collaborators pioneered the field of nanoscale infrared absorption spectroscopy and imaging. Our team is focused on providing robust chemical analysis with nanometer scale spatial resolution. With a researcher’s productivity always in mind, we deliver integrated hardware and software solutions that clear the path to your next discovery. Nanoscale IR spectroscopy complemented with thermal and mechanical analysis add a special dimension to AFM imaging.
Anasys Instruments, the world leader in nanoscale IR spectroscopy, is pleased to announce the nanoIR2-s nanoscale spectroscopy and imaging platform. The nanoIR2-s brings together two powerful techniques, AFM-IR and s-SNOM (scattering scanning near field optical microscopy). The AFM-IR is a proprietary Anasys technique that measures true model-free nanoscale IR absorption. The s-SNOM is a well-established scattered light measurement technique in the AFM field for sub-20nm complex optical property optical imaging.
Anasys Instruments has pioneered and introduced multiple major award-winning technologies: nanoscale thermal analysis (nano-TA, afm+), transition temperature microscopy (TTM), and nanoscale IR Spectroscopy (AFM-IR, s-SNOM, nanoIR2, nanoIR2s). Our products and technologies have won multiple awards including, R&D100, Microscopy Today Innovation, MicroNano 25, and most recently the prestigious Ernst Abbe Award.
Nanoscale IR Spectroscopy (AFM-IR)
Scattering near-field optical microscopy (s-SNOM)
Nanoscale thermal analysis (nanoTA)
Mechanical property mapping (LCR)
Resonance enhanced AFM-IR
Lorentz contact resonance
A.P.E. Research develops and produces Scanning Probe Microscopes (SPM) for surface analysis and for biological applications, and high-resolution scientific instrumentation for nanotechnologies. The technological core business of A.P.E. Research is the Scanning Probe Microscopy (SPM).
A.P.E. Research has its own laboratory for instrumentation development and moreover the company is involved in several research projects of Italian, European and International research institutes and Universities in developing new scanning probe microscopes and innovative techniques for probe microscopy. The result of this research activity allows the company to supply always the state of the art products in a wide range of fields.
The A.P.E. Research catalog contains a standard version of Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM) and Near Field Optical Microscopes (SNOM). All these products can be provided with many additional tools and customized to meet the needs of the customer.
The company started at the AREA Science Park in 1997 and since 1999 is officially recognized as a spin-off from the INFM (Italian National Institute for Condensed Matter Physics).
Atomic Force Microscopy AFM
Scanning Near-field Optical Microscopy SNOM
Scanning Tunneling Microscope STM
Scanning Probe Microscopy SPM: Images, Probes & Accessories
AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and research in AFM probes to supply the highest quality probes utilizing the latest technology in the market. Our in-house clean room facility combined with our state-of-the-art characterization tools enables rapid prototyping, adaptability, and versatility in designing and developing new products for our customers.
In addition to providing you with our standard catalog of products, major research programs are continuously underway both in-house and with external collaborators or customers to develop high performance probes and accessories for advanced SPM applications. Our experienced R&D Team takes pride in using our knowledge in silicon nanofabrication technology to realize these new ideas
Vertisense Thermal Microscopy Module
STM Tip Etcher
Custom MEMS & Nanofabrication
Characterization & Metrology
Custom Probe Mounting
Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications. Founded in 1999 and acquired by Oxford Instruments plc in 2012, we are dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 300 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, data storage and semiconductors, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more.
Precision and accuracy has been the driving force behind the pioneering AFM instrument innovations in flexure design, lowest-noise closed loop sensors, and full digital control. These are now requirements in any research grade AFM. Our open software, based in IGOR Pro, allows researchers the ease-of-use, and power and flexibility to take their experiments to the next level. These innovations, just to name a few, are offered in our two main product lines-the Cypher and MFP-3D AFM Families.
Designer and manufacturer of probes with carbon nanotube tips for atomic force microscopes.
New CDI FN Series a new series of CNT probes at a new low price.
CDI FN Series Carbon Nanotube probes capture all the advantages of a CNT tipped probe with no compromises. Extremely high aspect ratios (up to 20:1) Exceptionally long wear (up to 200x longer than silicon/SiN and 50x longer than High-Density, Diamond Like Carbon (HDC/DLC)) and the smallest ROC on the market for a High Aspect Ratio probe (1nm ROC).
Using a CDI patented process, the carbon nanotube AFM probe has been perfected. Straightened carbon nanotubes can deliver the radius of curvature needed for high resolution imaging combined with the tube structure necessary for high topography Imaging. All in a single probe with a useable lifetime up to 200x your standard probes.
For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME’s key points are easy usability, manufacturing by ourselves, and flexibility.
Our instruments are characterized by the simplest possible operation combined with the capability of a high throughput. When it comes to new developments, we take great care to secure that the instruments will not “feel” like a prototype afterwards. Naturally, also new developments are supported by corresponding software. Take cantilever change as an example: For our DS 95 AFM, exchanging the cantilever takes only some seconds. Adjustment and approach are fully automatic, and optionally we also offer a full automatic cantilever changer. Furthermore, all our AFM scanners have a built-in optics facilitating the location of a specific place on the sample surface. Both guarantee efficient work and a high throughput.
Our instruments are characterized by an optimal combination of mechanics, electronics, and software. Only by in-depth harmonization of all three components, a good scanning probe microscope can be obtained. Our developers work interdisciplinarily: To make a good control software the developer must for example have also a deep understanding of mechanics and electronics. In the same manner, the mechanical development process must consider how the electronics and software will later control the system. Actually, the real power of our team of developers lies in the interdisciplinary work and the permanent overview of the whole concept.
All main parts of our Scanning Probe Microscopes are of our own manufacture; this includes the piezo motors for approach, the electronics, our software, and naturally our mechanical design. This has the advantage that we are able to quickly make modifications in all parts of the instruments, should a certain application require such.
Optical Nearfield Microscopy
We provide high performance environmental solutions for precision instruments. This includes our acoustic enclosures, vibration isolation systems, Faraday cages and site survey tools. We specialize in supporting nanotechnology research.
Materials Science Applications: