AIST-NT, Novato CA, USA
With over 15 years experience in combined AFM/SPM/Raman Spectroscopy, our main focus is on the innovative research and development of advanced integrated scanning systems for nanotechnology.
Besides the most progressive engineering in the field including custom devices for OEM customers, outsourcing and R&D in nanotechnology, AIST-NT offers the highest quality service and customer support.
The SmartSPM 1000 Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes. With the SmartSPM zooming down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with NSOM, Raman and TERS/SERS techniques.
The CombiScope 1000 Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed only available from AIST-NT. Plus it can be easily upgraded to our OmegaScope AFM-Raman system
The OmegaScope 1000 is a state-of-the-art turn-key solution that combines confocal NanoRaman/ Fluorescence spectroscopy and ultra resolution multi-range research AFM enabling TERS (Tip Enhanced Raman Scattering) mapping. It is available in both transmission and reflection configurations providing direct top, bottom and side optical access. The flexibility of the OmegaScope platform offer almost endless possibilities in correlation of high spatial resolution Raman and AFM data.
SPM Accessories: A wide range of AFM probes, cantilevers, calibration gratings and test samples.